Quantification of Friction Force on Dual-Axis Micro-Mechanical Probe for Friction Force Microscopy

Conventional friction force microscopes (FFMs), where micro cantilever probes are used, have a disadvantage that the accurate quantification of friction force has not been established yet. This comes from the difficulty of measurement of the probe torsion angle. On the other hand, a recently develop...

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Autores principales: Hiroaki Amakawa, Kenji Fukuzawa, Mitsuhiro Shikida, Hedong Zhang, Shintaro Itoh
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Lenguaje:EN
Publicado: Japanese Society of Tribologists 2010
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Acceso en línea:https://doaj.org/article/0023e79799a2406a95a8de7a1a2f4d1d
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spelling oai:doaj.org-article:0023e79799a2406a95a8de7a1a2f4d1d2021-11-05T09:27:04ZQuantification of Friction Force on Dual-Axis Micro-Mechanical Probe for Friction Force Microscopy1881-219810.2474/trol.5.144https://doaj.org/article/0023e79799a2406a95a8de7a1a2f4d1d2010-07-01T00:00:00Zhttps://www.jstage.jst.go.jp/article/trol/5/3/5_3_144/_pdf/-char/enhttps://doaj.org/toc/1881-2198Conventional friction force microscopes (FFMs), where micro cantilever probes are used, have a disadvantage that the accurate quantification of friction force has not been established yet. This comes from the difficulty of measurement of the probe torsion angle. On the other hand, a recently developed dual-axis micro-mechanical probe does not require the torsion angle but the lateral displacement for the quantification of friction force. This probe measures the friction force with a double cantilever beam and the normal force with a torsion beam. Since the measurement of the lateral displacement is easier than that of the torsion angle, the dual-axis micro-mechanical probe is expected to provide more accurate and reproducible quantification. In this paper, we investigated two calibration methods for dual-axis micro-mechanical probes; probe adhesion and step structure methods. The probe adhesion method showed rather poor reproducibility for the lateral displacement detection. In contrast, the step structure method showed good reproducibility and good accuracy with the minimum detection limit of the order of 0.1 nm, which corresponds to the friction force of sub-nN for the probes with a spring constant of the order of 1 N/m. The dual-axis micro-mechanical probe can be used to quantify the nanotribological properties accurately.Hiroaki AmakawaKenji FukuzawaMitsuhiro ShikidaHedong ZhangShintaro ItohJapanese Society of Tribologistsarticleatomic force microscopefriction force microscopetribology, cantilever probePhysicsQC1-999Engineering (General). Civil engineering (General)TA1-2040Mechanical engineering and machineryTJ1-1570ChemistryQD1-999ENTribology Online, Vol 5, Iss 3, Pp 144-149 (2010)
institution DOAJ
collection DOAJ
language EN
topic atomic force microscope
friction force microscope
tribology, cantilever probe
Physics
QC1-999
Engineering (General). Civil engineering (General)
TA1-2040
Mechanical engineering and machinery
TJ1-1570
Chemistry
QD1-999
spellingShingle atomic force microscope
friction force microscope
tribology, cantilever probe
Physics
QC1-999
Engineering (General). Civil engineering (General)
TA1-2040
Mechanical engineering and machinery
TJ1-1570
Chemistry
QD1-999
Hiroaki Amakawa
Kenji Fukuzawa
Mitsuhiro Shikida
Hedong Zhang
Shintaro Itoh
Quantification of Friction Force on Dual-Axis Micro-Mechanical Probe for Friction Force Microscopy
description Conventional friction force microscopes (FFMs), where micro cantilever probes are used, have a disadvantage that the accurate quantification of friction force has not been established yet. This comes from the difficulty of measurement of the probe torsion angle. On the other hand, a recently developed dual-axis micro-mechanical probe does not require the torsion angle but the lateral displacement for the quantification of friction force. This probe measures the friction force with a double cantilever beam and the normal force with a torsion beam. Since the measurement of the lateral displacement is easier than that of the torsion angle, the dual-axis micro-mechanical probe is expected to provide more accurate and reproducible quantification. In this paper, we investigated two calibration methods for dual-axis micro-mechanical probes; probe adhesion and step structure methods. The probe adhesion method showed rather poor reproducibility for the lateral displacement detection. In contrast, the step structure method showed good reproducibility and good accuracy with the minimum detection limit of the order of 0.1 nm, which corresponds to the friction force of sub-nN for the probes with a spring constant of the order of 1 N/m. The dual-axis micro-mechanical probe can be used to quantify the nanotribological properties accurately.
format article
author Hiroaki Amakawa
Kenji Fukuzawa
Mitsuhiro Shikida
Hedong Zhang
Shintaro Itoh
author_facet Hiroaki Amakawa
Kenji Fukuzawa
Mitsuhiro Shikida
Hedong Zhang
Shintaro Itoh
author_sort Hiroaki Amakawa
title Quantification of Friction Force on Dual-Axis Micro-Mechanical Probe for Friction Force Microscopy
title_short Quantification of Friction Force on Dual-Axis Micro-Mechanical Probe for Friction Force Microscopy
title_full Quantification of Friction Force on Dual-Axis Micro-Mechanical Probe for Friction Force Microscopy
title_fullStr Quantification of Friction Force on Dual-Axis Micro-Mechanical Probe for Friction Force Microscopy
title_full_unstemmed Quantification of Friction Force on Dual-Axis Micro-Mechanical Probe for Friction Force Microscopy
title_sort quantification of friction force on dual-axis micro-mechanical probe for friction force microscopy
publisher Japanese Society of Tribologists
publishDate 2010
url https://doaj.org/article/0023e79799a2406a95a8de7a1a2f4d1d
work_keys_str_mv AT hiroakiamakawa quantificationoffrictionforceondualaxismicromechanicalprobeforfrictionforcemicroscopy
AT kenjifukuzawa quantificationoffrictionforceondualaxismicromechanicalprobeforfrictionforcemicroscopy
AT mitsuhiroshikida quantificationoffrictionforceondualaxismicromechanicalprobeforfrictionforcemicroscopy
AT hedongzhang quantificationoffrictionforceondualaxismicromechanicalprobeforfrictionforcemicroscopy
AT shintaroitoh quantificationoffrictionforceondualaxismicromechanicalprobeforfrictionforcemicroscopy
_version_ 1718444326145490944