Mass-Synthesized Solution-Processable Polyimide Gate Dielectrics for Electrically Stable Operating OFETs and Integrated Circuits

Polyimides (PIs) are widely utilized polymeric materials for high-temperature plastics, adhesives, dielectrics, nonlinear optical materials, flexible hard-coating films, and substrates for flexible electronics. PIs can be facilely mass-produced through factory methods, so the industrial application...

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Autores principales: Rixuan Wang, Joonjung Lee, Jisu Hong, Hyeok-jin Kwon, Heqing Ye, Juhyun Park, Chan Eon Park, Joon Ho Kim, Hyun Ho Choi, Kyuyoung Eom, Se Hyun Kim
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Publicado: MDPI AG 2021
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Acceso en línea:https://doaj.org/article/00be25abc4464ac9ab27bbc1342befb1
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spelling oai:doaj.org-article:00be25abc4464ac9ab27bbc1342befb12021-11-11T18:44:44ZMass-Synthesized Solution-Processable Polyimide Gate Dielectrics for Electrically Stable Operating OFETs and Integrated Circuits10.3390/polym132137152073-4360https://doaj.org/article/00be25abc4464ac9ab27bbc1342befb12021-10-01T00:00:00Zhttps://www.mdpi.com/2073-4360/13/21/3715https://doaj.org/toc/2073-4360Polyimides (PIs) are widely utilized polymeric materials for high-temperature plastics, adhesives, dielectrics, nonlinear optical materials, flexible hard-coating films, and substrates for flexible electronics. PIs can be facilely mass-produced through factory methods, so the industrial application value is limitless. Herein, we synthesized a typical poly(amic acid) (PAA) precursor-based solution through an industrialized reactor for mass production and applied the prepared solution to form thin films of PI using thermal imidization. The deposited PI thin films were successfully applied as gate dielectrics for organic field-effect transistors (OFETs). The PI layers showed suitable characteristics for dielectrics, such as a smooth surface, low leakage current density, uniform dielectric constant (k) values regardless of frequency, and compatibility with organic semiconductors. Utilizing this PI layer, we were able to fabricate electrically stable operated OFETs, which exhibited a threshold voltage shift lower than 1 V under bias-stress conditions and a field-effect mobility of 4.29 cm<sup>2</sup> V<sup>−1</sup> s<sup>−1</sup>. Moreover, integrated logic gates were manufactured using these well-operated OFETs and displayed suitable operation behavior.Rixuan WangJoonjung LeeJisu HongHyeok-jin KwonHeqing YeJuhyun ParkChan Eon ParkJoon Ho KimHyun Ho ChoiKyuyoung EomSe Hyun KimMDPI AGarticleorganic field-effect transistorgate dielectricpolyimideintegrated logic gatesOrganic chemistryQD241-441ENPolymers, Vol 13, Iss 3715, p 3715 (2021)
institution DOAJ
collection DOAJ
language EN
topic organic field-effect transistor
gate dielectric
polyimide
integrated logic gates
Organic chemistry
QD241-441
spellingShingle organic field-effect transistor
gate dielectric
polyimide
integrated logic gates
Organic chemistry
QD241-441
Rixuan Wang
Joonjung Lee
Jisu Hong
Hyeok-jin Kwon
Heqing Ye
Juhyun Park
Chan Eon Park
Joon Ho Kim
Hyun Ho Choi
Kyuyoung Eom
Se Hyun Kim
Mass-Synthesized Solution-Processable Polyimide Gate Dielectrics for Electrically Stable Operating OFETs and Integrated Circuits
description Polyimides (PIs) are widely utilized polymeric materials for high-temperature plastics, adhesives, dielectrics, nonlinear optical materials, flexible hard-coating films, and substrates for flexible electronics. PIs can be facilely mass-produced through factory methods, so the industrial application value is limitless. Herein, we synthesized a typical poly(amic acid) (PAA) precursor-based solution through an industrialized reactor for mass production and applied the prepared solution to form thin films of PI using thermal imidization. The deposited PI thin films were successfully applied as gate dielectrics for organic field-effect transistors (OFETs). The PI layers showed suitable characteristics for dielectrics, such as a smooth surface, low leakage current density, uniform dielectric constant (k) values regardless of frequency, and compatibility with organic semiconductors. Utilizing this PI layer, we were able to fabricate electrically stable operated OFETs, which exhibited a threshold voltage shift lower than 1 V under bias-stress conditions and a field-effect mobility of 4.29 cm<sup>2</sup> V<sup>−1</sup> s<sup>−1</sup>. Moreover, integrated logic gates were manufactured using these well-operated OFETs and displayed suitable operation behavior.
format article
author Rixuan Wang
Joonjung Lee
Jisu Hong
Hyeok-jin Kwon
Heqing Ye
Juhyun Park
Chan Eon Park
Joon Ho Kim
Hyun Ho Choi
Kyuyoung Eom
Se Hyun Kim
author_facet Rixuan Wang
Joonjung Lee
Jisu Hong
Hyeok-jin Kwon
Heqing Ye
Juhyun Park
Chan Eon Park
Joon Ho Kim
Hyun Ho Choi
Kyuyoung Eom
Se Hyun Kim
author_sort Rixuan Wang
title Mass-Synthesized Solution-Processable Polyimide Gate Dielectrics for Electrically Stable Operating OFETs and Integrated Circuits
title_short Mass-Synthesized Solution-Processable Polyimide Gate Dielectrics for Electrically Stable Operating OFETs and Integrated Circuits
title_full Mass-Synthesized Solution-Processable Polyimide Gate Dielectrics for Electrically Stable Operating OFETs and Integrated Circuits
title_fullStr Mass-Synthesized Solution-Processable Polyimide Gate Dielectrics for Electrically Stable Operating OFETs and Integrated Circuits
title_full_unstemmed Mass-Synthesized Solution-Processable Polyimide Gate Dielectrics for Electrically Stable Operating OFETs and Integrated Circuits
title_sort mass-synthesized solution-processable polyimide gate dielectrics for electrically stable operating ofets and integrated circuits
publisher MDPI AG
publishDate 2021
url https://doaj.org/article/00be25abc4464ac9ab27bbc1342befb1
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