APA (7th ed.) Citation

Halsey, W., Halsey, W., Rose, D., Scime, L., Scime, L., Dehoff, R., . . . Paquit, V. (2021). Localized Defect Detection from Spatially Mapped, In-Situ Process Data With Machine Learning. Frontiers Media S.A.

Chicago Style (17th ed.) Citation

Halsey, William, William Halsey, Derek Rose, Luke Scime, Luke Scime, Ryan Dehoff, Ryan Dehoff, Vincent Paquit, and Vincent Paquit. Localized Defect Detection from Spatially Mapped, In-Situ Process Data With Machine Learning. Frontiers Media S.A, 2021.

MLA (8th ed.) Citation

Halsey, William, et al. Localized Defect Detection from Spatially Mapped, In-Situ Process Data With Machine Learning. Frontiers Media S.A, 2021.