Cita APA (7a ed.)

Halsey, W., Halsey, W., Rose, D., Scime, L., Scime, L., Dehoff, R., . . . Paquit, V. (2021). Localized Defect Detection from Spatially Mapped, In-Situ Process Data With Machine Learning. Frontiers Media S.A.

Cita Chicago Style (17a ed.)

Halsey, William, William Halsey, Derek Rose, Luke Scime, Luke Scime, Ryan Dehoff, Ryan Dehoff, Vincent Paquit, y Vincent Paquit. Localized Defect Detection from Spatially Mapped, In-Situ Process Data With Machine Learning. Frontiers Media S.A, 2021.

Cita MLA (8a ed.)

Halsey, William, et al. Localized Defect Detection from Spatially Mapped, In-Situ Process Data With Machine Learning. Frontiers Media S.A, 2021.