Style de citation APA (7e éd.)

Halsey, W., Halsey, W., Rose, D., Scime, L., Scime, L., Dehoff, R., . . . Paquit, V. (2021). Localized Defect Detection from Spatially Mapped, In-Situ Process Data With Machine Learning. Frontiers Media S.A.

Style de citation Chicago (17e éd.)

Halsey, William, William Halsey, Derek Rose, Luke Scime, Luke Scime, Ryan Dehoff, Ryan Dehoff, Vincent Paquit, et Vincent Paquit. Localized Defect Detection from Spatially Mapped, In-Situ Process Data With Machine Learning. Frontiers Media S.A, 2021.

Style de citation MLA (8e éd.)

Halsey, William, et al. Localized Defect Detection from Spatially Mapped, In-Situ Process Data With Machine Learning. Frontiers Media S.A, 2021.