In situ single-shot diffractive fluence mapping for X-ray free-electron laser pulses

In situ single-shot diffractive fluence mapping for X-ray free-electron laser pulses

Free electron laser beam profile characterization is usually performed separately from the actual measurements and this leads to considerable uncertainty in the results. Here the authors demonstrate the simultaneous measurement of the FEL beam profile with the experiment by using integrated gratings...

Descripción completa

Guardado en:
Detalles Bibliográficos
Autores principales: Michael Schneider, Christian M. Günther, Bastian Pfau, Flavio Capotondi, Michele Manfredda, Marco Zangrando, Nicola Mahne, Lorenzo Raimondi, Emanuele Pedersoli, Denys Naumenko, Stefan Eisebitt
Formato: article
Lenguaje:EN
Publicado: Nature Portfolio 2018
Materias:
Science
Q
Acceso en línea:https://doaj.org/article/0217ec6e8fc0496fa0be7311bb0e6962
Etiquetas: Agregar Etiqueta
Sin Etiquetas, Sea el primero en etiquetar este registro!

Ejemplares similares

Ejemplares similares