Sub-diffraction error mapping for localisation microscopy images

Sub-diffraction error mapping for localisation microscopy images

Determining the quality of localisation microscopy images is currently challenging. Here the authors report use of the Haar wavelet kernel analysis (HAWK) Method for the Assessment of Nanoscopy, termed HAWKMAN, to assess the reliability of localisation information.

Guardado en:
Detalles Bibliográficos
Autores principales: Richard J. Marsh, Ishan Costello, Mark-Alexander Gorey, Donghan Ma, Fang Huang, Mathias Gautel, Maddy Parsons, Susan Cox
Formato: article
Lenguaje:EN
Publicado: Nature Portfolio 2021
Materias:
Science
Q
Acceso en línea:https://doaj.org/article/03772d4f48e44e92abfaab616baa537f
Etiquetas: Agregar Etiqueta
Sin Etiquetas, Sea el primero en etiquetar este registro!

Ejemplares similares

Ejemplares similares