Creep-fatigue life evaluation of Sn-3.5Ag lead-free solder at low temperatures

This paper describes creep-fatigue lives of Sn-3.5Ag lead-free solder at low temperatures. Since solders have lower melting temperature and electronic devices are often used at low temperature environment, it is effective for improving the fatigue life evaluating precision of solder joints to make c...

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Autor principal: Noritake HIYOSHI
Formato: article
Lenguaje:EN
Publicado: The Japan Society of Mechanical Engineers 2016
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Acceso en línea:https://doaj.org/article/03ff50b0c6e24567b56d88863e0e598b
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spelling oai:doaj.org-article:03ff50b0c6e24567b56d88863e0e598b2021-11-26T06:51:31ZCreep-fatigue life evaluation of Sn-3.5Ag lead-free solder at low temperatures2187-974510.1299/mej.16-00081https://doaj.org/article/03ff50b0c6e24567b56d88863e0e598b2016-05-01T00:00:00Zhttps://www.jstage.jst.go.jp/article/mej/3/3/3_16-00081/_pdf/-char/enhttps://doaj.org/toc/2187-9745This paper describes creep-fatigue lives of Sn-3.5Ag lead-free solder at low temperatures. Since solders have lower melting temperature and electronic devices are often used at low temperature environment, it is effective for improving the fatigue life evaluating precision of solder joints to make clear the mechanical properties and creep-fatigue properties of solders at low temperatures. Cyclic push-pull fatigue tests with various strain waveforms were conducted at 253K and 273K to examine influence of strain rate and testing temperature on fatigue life of Sn-3.5Ag lead-free solder. Creep-fatigue lives under unsymmetrical full reversed strain waveform were smaller than that of symmetrical waveform at low temperatures. An application of five kinds of creep-fatigue life evaluation parameters for electronic materials at low temperatures was also discussed. They are Linear Damage Rule, Frequency Modified Fatigue Life, Ductility Exhaustion Model, Strain Range Partitioning method and Grain Boundary Sliding Model. Grain Boundary Sliding Model, which has been proposed as a fatigue life evaluation parameter for Pb-content solders and lead-free solders at high temperatures, was a suitable parameter for the correlation of creep-fatigue lives of Sn-3.5Ag lead-free solder at low temperatures. Grain Boundary Sliding Model parameter predicted almost all of the experimental lifetimes within a small scatter conservatively.Noritake HIYOSHIThe Japan Society of Mechanical Engineersarticlecreep-fatigueelectronic materialslife predictionlow temperature fatiguesolderMechanical engineering and machineryTJ1-1570ENMechanical Engineering Journal, Vol 3, Iss 3, Pp 16-00081-16-00081 (2016)
institution DOAJ
collection DOAJ
language EN
topic creep-fatigue
electronic materials
life prediction
low temperature fatigue
solder
Mechanical engineering and machinery
TJ1-1570
spellingShingle creep-fatigue
electronic materials
life prediction
low temperature fatigue
solder
Mechanical engineering and machinery
TJ1-1570
Noritake HIYOSHI
Creep-fatigue life evaluation of Sn-3.5Ag lead-free solder at low temperatures
description This paper describes creep-fatigue lives of Sn-3.5Ag lead-free solder at low temperatures. Since solders have lower melting temperature and electronic devices are often used at low temperature environment, it is effective for improving the fatigue life evaluating precision of solder joints to make clear the mechanical properties and creep-fatigue properties of solders at low temperatures. Cyclic push-pull fatigue tests with various strain waveforms were conducted at 253K and 273K to examine influence of strain rate and testing temperature on fatigue life of Sn-3.5Ag lead-free solder. Creep-fatigue lives under unsymmetrical full reversed strain waveform were smaller than that of symmetrical waveform at low temperatures. An application of five kinds of creep-fatigue life evaluation parameters for electronic materials at low temperatures was also discussed. They are Linear Damage Rule, Frequency Modified Fatigue Life, Ductility Exhaustion Model, Strain Range Partitioning method and Grain Boundary Sliding Model. Grain Boundary Sliding Model, which has been proposed as a fatigue life evaluation parameter for Pb-content solders and lead-free solders at high temperatures, was a suitable parameter for the correlation of creep-fatigue lives of Sn-3.5Ag lead-free solder at low temperatures. Grain Boundary Sliding Model parameter predicted almost all of the experimental lifetimes within a small scatter conservatively.
format article
author Noritake HIYOSHI
author_facet Noritake HIYOSHI
author_sort Noritake HIYOSHI
title Creep-fatigue life evaluation of Sn-3.5Ag lead-free solder at low temperatures
title_short Creep-fatigue life evaluation of Sn-3.5Ag lead-free solder at low temperatures
title_full Creep-fatigue life evaluation of Sn-3.5Ag lead-free solder at low temperatures
title_fullStr Creep-fatigue life evaluation of Sn-3.5Ag lead-free solder at low temperatures
title_full_unstemmed Creep-fatigue life evaluation of Sn-3.5Ag lead-free solder at low temperatures
title_sort creep-fatigue life evaluation of sn-3.5ag lead-free solder at low temperatures
publisher The Japan Society of Mechanical Engineers
publishDate 2016
url https://doaj.org/article/03ff50b0c6e24567b56d88863e0e598b
work_keys_str_mv AT noritakehiyoshi creepfatiguelifeevaluationofsn35agleadfreesolderatlowtemperatures
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