Tricuspid insufficiency after cardiac-implantable electronic device placement

Objective Device-related estimates of incidence and significance of tricuspid regurgitation (TR) is mainly based on case reports and small observational studies. We sought to determine whether right-heart device implantation increased the risk of TR in this interventional study. Methods All patients...

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Autores principales: Nismat Javed, Raafe Iqbal, Jahanzeb Malik, Ghazanfar Rana, Waheed Akhtar, Syed Muhammad Jawad Zaidi
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Lenguaje:EN
Publicado: Taylor & Francis Group 2021
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Acceso en línea:https://doaj.org/article/04855d73f28a4c44b2260d69b188396b
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spelling oai:doaj.org-article:04855d73f28a4c44b2260d69b188396b2021-11-17T14:21:57ZTricuspid insufficiency after cardiac-implantable electronic device placement2000-966610.1080/20009666.2021.1967569https://doaj.org/article/04855d73f28a4c44b2260d69b188396b2021-11-01T00:00:00Zhttp://dx.doi.org/10.1080/20009666.2021.1967569https://doaj.org/toc/2000-9666Objective Device-related estimates of incidence and significance of tricuspid regurgitation (TR) is mainly based on case reports and small observational studies. We sought to determine whether right-heart device implantation increased the risk of TR in this interventional study. Methods All patients who underwent permanent pacemaker (PPM) or other device implantation were assessed for degree of TR at one year. The data collected was analyzed on IBM SPSS version 26. Descriptive statistics were applied for qualitative variables. Mean and standard deviation were applied for quantitative variables. Regression analysis and paired t-tests were applied for the degree of change and predictors of TR. Results Out of 165 participants, 73.94% were male. The mean age of the participants was 59.86 ± 12.03 years. Dual-chamber pacemaker (DDDR) was the most common device implanted (78.18%) causing significant TR and drop in left ventricular ejection fraction as compared to other devices (p-value < 0.05). The paired t-test for changes in ejection fraction (LVEF) and TR were also significant (p-value < 0.05). A regression model predicted significant TR to depend on baseline LVEF (p-value < 0.05). Conclusion Device-related worsening of TR is related to mechanical mechanisms. It is significantly associated with DDDR pacemakers after a 1-year follow-up.Nismat JavedRaafe IqbalJahanzeb MalikGhazanfar RanaWaheed AkhtarSyed Muhammad Jawad ZaidiTaylor & Francis Grouparticletricuspid regurgitationejection fractionimplantation devicesheart blockheart failureInternal medicineRC31-1245ENJournal of Community Hospital Internal Medicine Perspectives, Vol 11, Iss 6, Pp 793-798 (2021)
institution DOAJ
collection DOAJ
language EN
topic tricuspid regurgitation
ejection fraction
implantation devices
heart block
heart failure
Internal medicine
RC31-1245
spellingShingle tricuspid regurgitation
ejection fraction
implantation devices
heart block
heart failure
Internal medicine
RC31-1245
Nismat Javed
Raafe Iqbal
Jahanzeb Malik
Ghazanfar Rana
Waheed Akhtar
Syed Muhammad Jawad Zaidi
Tricuspid insufficiency after cardiac-implantable electronic device placement
description Objective Device-related estimates of incidence and significance of tricuspid regurgitation (TR) is mainly based on case reports and small observational studies. We sought to determine whether right-heart device implantation increased the risk of TR in this interventional study. Methods All patients who underwent permanent pacemaker (PPM) or other device implantation were assessed for degree of TR at one year. The data collected was analyzed on IBM SPSS version 26. Descriptive statistics were applied for qualitative variables. Mean and standard deviation were applied for quantitative variables. Regression analysis and paired t-tests were applied for the degree of change and predictors of TR. Results Out of 165 participants, 73.94% were male. The mean age of the participants was 59.86 ± 12.03 years. Dual-chamber pacemaker (DDDR) was the most common device implanted (78.18%) causing significant TR and drop in left ventricular ejection fraction as compared to other devices (p-value < 0.05). The paired t-test for changes in ejection fraction (LVEF) and TR were also significant (p-value < 0.05). A regression model predicted significant TR to depend on baseline LVEF (p-value < 0.05). Conclusion Device-related worsening of TR is related to mechanical mechanisms. It is significantly associated with DDDR pacemakers after a 1-year follow-up.
format article
author Nismat Javed
Raafe Iqbal
Jahanzeb Malik
Ghazanfar Rana
Waheed Akhtar
Syed Muhammad Jawad Zaidi
author_facet Nismat Javed
Raafe Iqbal
Jahanzeb Malik
Ghazanfar Rana
Waheed Akhtar
Syed Muhammad Jawad Zaidi
author_sort Nismat Javed
title Tricuspid insufficiency after cardiac-implantable electronic device placement
title_short Tricuspid insufficiency after cardiac-implantable electronic device placement
title_full Tricuspid insufficiency after cardiac-implantable electronic device placement
title_fullStr Tricuspid insufficiency after cardiac-implantable electronic device placement
title_full_unstemmed Tricuspid insufficiency after cardiac-implantable electronic device placement
title_sort tricuspid insufficiency after cardiac-implantable electronic device placement
publisher Taylor & Francis Group
publishDate 2021
url https://doaj.org/article/04855d73f28a4c44b2260d69b188396b
work_keys_str_mv AT nismatjaved tricuspidinsufficiencyaftercardiacimplantableelectronicdeviceplacement
AT raafeiqbal tricuspidinsufficiencyaftercardiacimplantableelectronicdeviceplacement
AT jahanzebmalik tricuspidinsufficiencyaftercardiacimplantableelectronicdeviceplacement
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