Multi-pass transmission electron microscopy

Feynman once asked physicists to build better electron microscopes to be able to watch biology at work. While electron microscopes can now provide atomic resolution, electron beam induced specimen damage precludes high resolution imaging of sensitive materials, such as single proteins or polymers. H...

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Autores principales: Thomas Juffmann, Stewart A. Koppell, Brannon B. Klopfer, Colin Ophus, Robert M. Glaeser, Mark A. Kasevich
Formato: article
Lenguaje:EN
Publicado: Nature Portfolio 2017
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Acceso en línea:https://doaj.org/article/05664e9adc6440389dfa58b953d0c968
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spelling oai:doaj.org-article:05664e9adc6440389dfa58b953d0c9682021-12-02T16:06:02ZMulti-pass transmission electron microscopy10.1038/s41598-017-01841-x2045-2322https://doaj.org/article/05664e9adc6440389dfa58b953d0c9682017-05-01T00:00:00Zhttps://doi.org/10.1038/s41598-017-01841-xhttps://doaj.org/toc/2045-2322Feynman once asked physicists to build better electron microscopes to be able to watch biology at work. While electron microscopes can now provide atomic resolution, electron beam induced specimen damage precludes high resolution imaging of sensitive materials, such as single proteins or polymers. Here, we use simulations to show that an electron microscope based on a multi-pass measurement protocol enables imaging of single proteins, without averaging structures over multiple images. While we demonstrate the method for particular imaging targets, the approach is broadly applicable and is expected to improve resolution and sensitivity for a range of electron microscopy imaging modalities, including, for example, scanning and spectroscopic techniques. The approach implements a quantum mechanically optimal strategy which under idealized conditions can be considered interaction-free.Thomas JuffmannStewart A. KoppellBrannon B. KlopferColin OphusRobert M. GlaeserMark A. KasevichNature PortfolioarticleMedicineRScienceQENScientific Reports, Vol 7, Iss 1, Pp 1-7 (2017)
institution DOAJ
collection DOAJ
language EN
topic Medicine
R
Science
Q
spellingShingle Medicine
R
Science
Q
Thomas Juffmann
Stewart A. Koppell
Brannon B. Klopfer
Colin Ophus
Robert M. Glaeser
Mark A. Kasevich
Multi-pass transmission electron microscopy
description Feynman once asked physicists to build better electron microscopes to be able to watch biology at work. While electron microscopes can now provide atomic resolution, electron beam induced specimen damage precludes high resolution imaging of sensitive materials, such as single proteins or polymers. Here, we use simulations to show that an electron microscope based on a multi-pass measurement protocol enables imaging of single proteins, without averaging structures over multiple images. While we demonstrate the method for particular imaging targets, the approach is broadly applicable and is expected to improve resolution and sensitivity for a range of electron microscopy imaging modalities, including, for example, scanning and spectroscopic techniques. The approach implements a quantum mechanically optimal strategy which under idealized conditions can be considered interaction-free.
format article
author Thomas Juffmann
Stewart A. Koppell
Brannon B. Klopfer
Colin Ophus
Robert M. Glaeser
Mark A. Kasevich
author_facet Thomas Juffmann
Stewart A. Koppell
Brannon B. Klopfer
Colin Ophus
Robert M. Glaeser
Mark A. Kasevich
author_sort Thomas Juffmann
title Multi-pass transmission electron microscopy
title_short Multi-pass transmission electron microscopy
title_full Multi-pass transmission electron microscopy
title_fullStr Multi-pass transmission electron microscopy
title_full_unstemmed Multi-pass transmission electron microscopy
title_sort multi-pass transmission electron microscopy
publisher Nature Portfolio
publishDate 2017
url https://doaj.org/article/05664e9adc6440389dfa58b953d0c968
work_keys_str_mv AT thomasjuffmann multipasstransmissionelectronmicroscopy
AT stewartakoppell multipasstransmissionelectronmicroscopy
AT brannonbklopfer multipasstransmissionelectronmicroscopy
AT colinophus multipasstransmissionelectronmicroscopy
AT robertmglaeser multipasstransmissionelectronmicroscopy
AT markakasevich multipasstransmissionelectronmicroscopy
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