Analysis of the Conduction Mechanism and Copper Vacancy Density in p-type Cu2O Thin Films
Abstract A quantitative and analytical investigation on the conduction mechanism in p-type cuprous oxide (Cu2O) thin films is performed based on analysis of the relative dominance of trap-limited and grain-boundary-limited conduction. It is found that carrier transport in as-deposited Cu2O is govern...
Saved in:
| Main Authors: | , |
|---|---|
| Format: | article |
| Language: | EN |
| Published: |
Nature Portfolio
2017
|
| Subjects: | |
| Online Access: | https://doaj.org/article/064a34c83afb43f99bb7d088bb4b1b88 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|