Focused ion beam treatment of ZnO nanowires

We investigated vapour-liquid-solid (VLS)-grown ZnO nanowires (NWs) on a Si sub- strate by scanning electron microscopy (SEM). Nanowires are found in a variety of shapes, surface properties and features, but seem to be all homogeneous inside. Darkish spots and areas on the surface are easily remo...

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Autor principal:	Shmavonyan, G.
Formato:	article
Lenguaje:	EN
Publicado:	D.Ghitu Institute of Electronic Engineering and Nanotechnologies 2009
Materias:	Physics QC1-999 Electronics TK7800-8360
Acceso en línea:	https://doaj.org/article/0b9c47d9b15a4903915aee17fc8afd35
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spelling	oai:doaj.org-article:0b9c47d9b15a4903915aee17fc8afd352021-11-21T12:05:21ZFocused ion beam treatment of ZnO nanowires 2537-63651810-648Xhttps://doaj.org/article/0b9c47d9b15a4903915aee17fc8afd352009-05-01T00:00:00Zhttps://mjps.nanotech.md/archive/2009/article/4113https://doaj.org/toc/1810-648Xhttps://doaj.org/toc/2537-6365We investigated vapour-liquid-solid (VLS)-grown ZnO nanowires (NWs) on a Si sub- strate by scanning electron microscopy (SEM). Nanowires are found in a variety of shapes, surface properties and features, but seem to be all homogeneous inside. Darkish spots and areas on the surface are easily removed by a “gentle” focused ion beam (FIB) treatment. To unveil their deeper interior, we also applied FIB treatment. An overview of our results (SEM images) is given in this paper. Shmavonyan, G.D.Ghitu Institute of Electronic Engineering and NanotechnologiesarticlePhysicsQC1-999ElectronicsTK7800-8360ENMoldavian Journal of the Physical Sciences, Vol 8, Iss 2, Pp 201-206 (2009)
institution	DOAJ
collection	DOAJ
language	EN
topic	Physics QC1-999 Electronics TK7800-8360
spellingShingle	Physics QC1-999 Electronics TK7800-8360 Shmavonyan, G. Focused ion beam treatment of ZnO nanowires
description	We investigated vapour-liquid-solid (VLS)-grown ZnO nanowires (NWs) on a Si sub- strate by scanning electron microscopy (SEM). Nanowires are found in a variety of shapes, surface properties and features, but seem to be all homogeneous inside. Darkish spots and areas on the surface are easily removed by a “gentle” focused ion beam (FIB) treatment. To unveil their deeper interior, we also applied FIB treatment. An overview of our results (SEM images) is given in this paper.
format	article
author	Shmavonyan, G.
author_facet	Shmavonyan, G.
author_sort	Shmavonyan, G.
title	Focused ion beam treatment of ZnO nanowires
title_short	Focused ion beam treatment of ZnO nanowires
title_full	Focused ion beam treatment of ZnO nanowires
title_fullStr	Focused ion beam treatment of ZnO nanowires
title_full_unstemmed	Focused ion beam treatment of ZnO nanowires
title_sort	focused ion beam treatment of zno nanowires
publisher	D.Ghitu Institute of Electronic Engineering and Nanotechnologies
publishDate	2009
url	https://doaj.org/article/0b9c47d9b15a4903915aee17fc8afd35
work_keys_str_mv	AT shmavonyang focusedionbeamtreatmentofznonanowires
_version_	1718419225959202816

Focused ion beam treatment of ZnO nanowires

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