Steep Subthreshold Swing and Enhanced Illumination Stability InGaZnO Thin-Film Transistor by Plasma Oxidation on Silicon Nitride Gate Dielectric

In this paper, an InGaZnO thin-film transistor (TFT) based on plasma oxidation of silicon nitride (SiN<sub>x</sub>) gate dielectric with small subthreshold swing (SS) and enhanced stability under negative bias illumination stress (NBIS) have been investigated in detail. The mechanism of...

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Autores principales: Yiming Liu, Chang Liu, Houyun Qin, Chong Peng, Mingxin Lu, Zhanguo Chen, Yi Zhao
Formato: article
Lenguaje:EN
Publicado: MDPI AG 2021
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Acceso en línea:https://doaj.org/article/0cca4dc1b7b749e685b0287fe2b32eb8
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