Identification of crystal symmetry from noisy diffraction patterns by a shape analysis and deep learning

Abstract The robust and automated determination of crystal symmetry is of utmost importance in material characterization and analysis. Recent studies have shown that deep learning (DL) methods can effectively reveal the correlations between X-ray or electron-beam diffraction patterns and crystal sym...

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Auteurs principaux: Leslie Ching Ow Tiong, Jeongrae Kim, Sang Soo Han, Donghun Kim
Format: article
Langue:EN
Publié: Nature Portfolio 2020
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Accès en ligne:https://doaj.org/article/0d364a8f4eba4550813da789ef5c508a
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