Cita APA (7a ed.)

Moise, C. C., Pantazi, A., Mihai, G. V., Jderu, A., Bercu, M., Messina, A. A., & Enăchescu, M. (2021). Surface Topography of Si/TiO₂ Stacked Layers on Silicon Substrate Deposited by KrF Excimer Laser Ablation. MDPI AG.

Cita Chicago Style (17a ed.)

Moise, Călin Constantin, Aida Pantazi, Geanina Valentina Mihai, Alin Jderu, Mircea Bercu, Angelo Alberto Messina, y Marius Enăchescu. Surface Topography of Si/TiO₂ Stacked Layers on Silicon Substrate Deposited by KrF Excimer Laser Ablation. MDPI AG, 2021.

Cita MLA (8a ed.)

Moise, Călin Constantin, et al. Surface Topography of Si/TiO₂ Stacked Layers on Silicon Substrate Deposited by KrF Excimer Laser Ablation. MDPI AG, 2021.