Dielectric screening in perovskite photovoltaics

Performance of perovskite photovoltaics is greatly affected by undesirable defects that contribute to non-radiative losses. Here, the authors mitigate these losses by doping perovskite with KI to alter the dielectric response, thus defect capturing probability, resulting in inverted device with PCE...

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Autores principales:	Rui Su, Zhaojian Xu, Jiang Wu, Deying Luo, Qin Hu, Wenqiang Yang, Xiaoyu Yang, Ruopeng Zhang, Hongyu Yu, Thomas P. Russell, Qihuang Gong, Wei Zhang, Rui Zhu
Formato:	article
Lenguaje:	EN
Publicado:	Nature Portfolio 2021
Materias:	Science Q
Acceso en línea:	https://doaj.org/article/0f2ef6eca75b4333bb624af0cd5e098f
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spelling	oai:doaj.org-article:0f2ef6eca75b4333bb624af0cd5e098f2021-12-02T16:55:53ZDielectric screening in perovskite photovoltaics10.1038/s41467-021-22783-z2041-1723https://doaj.org/article/0f2ef6eca75b4333bb624af0cd5e098f2021-04-01T00:00:00Zhttps://doi.org/10.1038/s41467-021-22783-zhttps://doaj.org/toc/2041-1723Performance of perovskite photovoltaics is greatly affected by undesirable defects that contribute to non-radiative losses. Here, the authors mitigate these losses by doping perovskite with KI to alter the dielectric response, thus defect capturing probability, resulting in inverted device with PCE of 22.3% and low voltage loss.Rui SuZhaojian XuJiang WuDeying LuoQin HuWenqiang YangXiaoyu YangRuopeng ZhangHongyu YuThomas P. RussellQihuang GongWei ZhangRui ZhuNature PortfolioarticleScienceQENNature Communications, Vol 12, Iss 1, Pp 1-11 (2021)
institution	DOAJ
collection	DOAJ
language	EN
topic	Science Q
spellingShingle	Science Q Rui Su Zhaojian Xu Jiang Wu Deying Luo Qin Hu Wenqiang Yang Xiaoyu Yang Ruopeng Zhang Hongyu Yu Thomas P. Russell Qihuang Gong Wei Zhang Rui Zhu Dielectric screening in perovskite photovoltaics
description	Performance of perovskite photovoltaics is greatly affected by undesirable defects that contribute to non-radiative losses. Here, the authors mitigate these losses by doping perovskite with KI to alter the dielectric response, thus defect capturing probability, resulting in inverted device with PCE of 22.3% and low voltage loss.
format	article
author	Rui Su Zhaojian Xu Jiang Wu Deying Luo Qin Hu Wenqiang Yang Xiaoyu Yang Ruopeng Zhang Hongyu Yu Thomas P. Russell Qihuang Gong Wei Zhang Rui Zhu
author_facet	Rui Su Zhaojian Xu Jiang Wu Deying Luo Qin Hu Wenqiang Yang Xiaoyu Yang Ruopeng Zhang Hongyu Yu Thomas P. Russell Qihuang Gong Wei Zhang Rui Zhu
author_sort	Rui Su
title	Dielectric screening in perovskite photovoltaics
title_short	Dielectric screening in perovskite photovoltaics
title_full	Dielectric screening in perovskite photovoltaics
title_fullStr	Dielectric screening in perovskite photovoltaics
title_full_unstemmed	Dielectric screening in perovskite photovoltaics
title_sort	dielectric screening in perovskite photovoltaics
publisher	Nature Portfolio
publishDate	2021
url	https://doaj.org/article/0f2ef6eca75b4333bb624af0cd5e098f
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_version_	1718382781649649664

Dielectric screening in perovskite photovoltaics

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