Raman Study of Polycrystalline Si<sub>3</sub>N<sub>4</sub> Irradiated with Swift Heavy Ions
A depth-resolved Raman spectroscopy technique was used to study the residual stress profiles in polycrystalline silicon nitride that was irradiated with Xe (167 MeV, 1 × 10<sup>11</sup> cm<sup>−2</sup> ÷ 4.87 × 10<sup>13</sup> cm<sup>−2</sup>) and Bi (...
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Autores principales: | Ainash Zhumazhanova, Alisher Mutali, Anel Ibrayeva, Vladimir Skuratov, Alma Dauletbekova, Ekaterina Korneeva, Abdirash Akilbekov, Maxim Zdorovets |
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Formato: | article |
Lenguaje: | EN |
Publicado: |
MDPI AG
2021
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Materias: | |
Acceso en línea: | https://doaj.org/article/1088c9dcecff4fdbab4738b9dcafdaae |
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