Caraman, M., Evtodiev, I., Rusu, M., Salaoru, I., & Vatavu-Cuculescu, E. (2005). Ellipsometric studies of nanometric CdS and CdTe films. D.Ghitu Institute of Electronic Engineering and Nanotechnologies.
Cita Chicago Style (17a ed.)Caraman, Mihail, Igor Evtodiev, Marin Rusu, Iurie Salaoru, y Elmira Vatavu-Cuculescu. Ellipsometric Studies of Nanometric CdS and CdTe Films. D.Ghitu Institute of Electronic Engineering and Nanotechnologies, 2005.
Cita MLA (8a ed.)Caraman, Mihail, et al. Ellipsometric Studies of Nanometric CdS and CdTe Films. D.Ghitu Institute of Electronic Engineering and Nanotechnologies, 2005.
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