A dual distance metrics method for improving classification performance
Abstract Distance metric forms the basis of pattern classification, as almost all classifiers depend on such a metric for making classification decisions. However, the existing research testifies that a single‐distance metric is not robust enough for classification. In this Letter, the authors propo...
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| Auteurs principaux: | , , , , |
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| Format: | article |
| Langue: | EN |
| Publié: |
Wiley
2021
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| Sujets: | |
| Accès en ligne: | https://doaj.org/article/1743ddb7fea14b2bbd68bad9ad700cc5 |
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