High-energy, high-resolution, fly-scan X-ray phase tomography

Abstract High energy X-ray phase contrast tomography is tremendously beneficial to the study of thick and dense materials with poor attenuation contrast. Recently, the X-ray speckle-based imaging technique has attracted widespread interest because multimodal contrast images can now be retrieved simu...

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Autores principales:	Hongchang Wang, Robert C. Atwood, Matthew James Pankhurst, Yogesh Kashyap, Biao Cai, Tunhe Zhou, Peter David Lee, Michael Drakopoulos, Kawal Sawhney
Formato:	article
Lenguaje:	EN
Publicado:	Nature Portfolio 2019
Materias:	Medicine R Science Q
Acceso en línea:	https://doaj.org/article/188d7dfe7ff744a69529bbc88d04823b
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spelling	oai:doaj.org-article:188d7dfe7ff744a69529bbc88d04823b2021-12-02T15:08:10ZHigh-energy, high-resolution, fly-scan X-ray phase tomography10.1038/s41598-019-45561-w2045-2322https://doaj.org/article/188d7dfe7ff744a69529bbc88d04823b2019-06-01T00:00:00Zhttps://doi.org/10.1038/s41598-019-45561-whttps://doaj.org/toc/2045-2322Abstract High energy X-ray phase contrast tomography is tremendously beneficial to the study of thick and dense materials with poor attenuation contrast. Recently, the X-ray speckle-based imaging technique has attracted widespread interest because multimodal contrast images can now be retrieved simultaneously using an inexpensive wavefront modulator and a less stringent experimental setup. However, it is time-consuming to perform high resolution phase tomography with the conventional step-scan mode because the accumulated time overhead severely limits the speed of data acquisition for each projection. Although phase information can be extracted from a single speckle image, the spatial resolution is deteriorated due to the use of a large correlation window to track the speckle displacement. Here we report a fast data acquisition strategy utilising a fly-scan mode for near field X-ray speckle-based phase tomography. Compared to the existing step-scan scheme, the data acquisition time can be significantly reduced by more than one order of magnitude without compromising spatial resolution. Furthermore, we have extended the proposed speckle-based fly-scan phase tomography into the previously challenging high X-ray energy region (120 keV). This development opens up opportunities for a wide range of applications where exposure time and radiation dose are critical.Hongchang WangRobert C. AtwoodMatthew James PankhurstYogesh KashyapBiao CaiTunhe ZhouPeter David LeeMichael DrakopoulosKawal SawhneyNature PortfolioarticleMedicineRScienceQENScientific Reports, Vol 9, Iss 1, Pp 1-11 (2019)
institution	DOAJ
collection	DOAJ
language	EN
topic	Medicine R Science Q
spellingShingle	Medicine R Science Q Hongchang Wang Robert C. Atwood Matthew James Pankhurst Yogesh Kashyap Biao Cai Tunhe Zhou Peter David Lee Michael Drakopoulos Kawal Sawhney High-energy, high-resolution, fly-scan X-ray phase tomography
description	Abstract High energy X-ray phase contrast tomography is tremendously beneficial to the study of thick and dense materials with poor attenuation contrast. Recently, the X-ray speckle-based imaging technique has attracted widespread interest because multimodal contrast images can now be retrieved simultaneously using an inexpensive wavefront modulator and a less stringent experimental setup. However, it is time-consuming to perform high resolution phase tomography with the conventional step-scan mode because the accumulated time overhead severely limits the speed of data acquisition for each projection. Although phase information can be extracted from a single speckle image, the spatial resolution is deteriorated due to the use of a large correlation window to track the speckle displacement. Here we report a fast data acquisition strategy utilising a fly-scan mode for near field X-ray speckle-based phase tomography. Compared to the existing step-scan scheme, the data acquisition time can be significantly reduced by more than one order of magnitude without compromising spatial resolution. Furthermore, we have extended the proposed speckle-based fly-scan phase tomography into the previously challenging high X-ray energy region (120 keV). This development opens up opportunities for a wide range of applications where exposure time and radiation dose are critical.
format	article
author	Hongchang Wang Robert C. Atwood Matthew James Pankhurst Yogesh Kashyap Biao Cai Tunhe Zhou Peter David Lee Michael Drakopoulos Kawal Sawhney
author_facet	Hongchang Wang Robert C. Atwood Matthew James Pankhurst Yogesh Kashyap Biao Cai Tunhe Zhou Peter David Lee Michael Drakopoulos Kawal Sawhney
author_sort	Hongchang Wang
title	High-energy, high-resolution, fly-scan X-ray phase tomography
title_short	High-energy, high-resolution, fly-scan X-ray phase tomography
title_full	High-energy, high-resolution, fly-scan X-ray phase tomography
title_fullStr	High-energy, high-resolution, fly-scan X-ray phase tomography
title_full_unstemmed	High-energy, high-resolution, fly-scan X-ray phase tomography
title_sort	high-energy, high-resolution, fly-scan x-ray phase tomography
publisher	Nature Portfolio
publishDate	2019
url	https://doaj.org/article/188d7dfe7ff744a69529bbc88d04823b
work_keys_str_mv	AT hongchangwang highenergyhighresolutionflyscanxrayphasetomography AT robertcatwood highenergyhighresolutionflyscanxrayphasetomography AT matthewjamespankhurst highenergyhighresolutionflyscanxrayphasetomography AT yogeshkashyap highenergyhighresolutionflyscanxrayphasetomography AT biaocai highenergyhighresolutionflyscanxrayphasetomography AT tunhezhou highenergyhighresolutionflyscanxrayphasetomography AT peterdavidlee highenergyhighresolutionflyscanxrayphasetomography AT michaeldrakopoulos highenergyhighresolutionflyscanxrayphasetomography AT kawalsawhney highenergyhighresolutionflyscanxrayphasetomography
_version_	1718388235754799104

High-energy, high-resolution, fly-scan X-ray phase tomography

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