Cita APA (7a ed.)

Zhixin, L., Meiling, J., Yanglin, H., Feng, L., Bo, S., Xing, Z., & Zheyu, F. (2018). Scanning cathodoluminescence microscopy: Applications in semiconductor and metallic nanostructures. Institue of Optics and Electronics, Chinese Academy of Sciences.

Cita Chicago Style (17a ed.)

Zhixin, Liu, Jiang Meiling, Hu Yanglin, Lin Feng, Shen Bo, Zhu Xing, y Fang Zheyu. Scanning Cathodoluminescence Microscopy: Applications in Semiconductor and Metallic Nanostructures. Institue of Optics and Electronics, Chinese Academy of Sciences, 2018.

Cita MLA (8a ed.)

Zhixin, Liu, et al. Scanning Cathodoluminescence Microscopy: Applications in Semiconductor and Metallic Nanostructures. Institue of Optics and Electronics, Chinese Academy of Sciences, 2018.