Zhixin, L., Meiling, J., Yanglin, H., Feng, L., Bo, S., Xing, Z., & Zheyu, F. (2018). Scanning cathodoluminescence microscopy: Applications in semiconductor and metallic nanostructures. Institue of Optics and Electronics, Chinese Academy of Sciences.
Style de citation Chicago (17e éd.)Zhixin, Liu, Jiang Meiling, Hu Yanglin, Lin Feng, Shen Bo, Zhu Xing, et Fang Zheyu. Scanning Cathodoluminescence Microscopy: Applications in Semiconductor and Metallic Nanostructures. Institue of Optics and Electronics, Chinese Academy of Sciences, 2018.
Style de citation MLA (8e éd.)Zhixin, Liu, et al. Scanning Cathodoluminescence Microscopy: Applications in Semiconductor and Metallic Nanostructures. Institue of Optics and Electronics, Chinese Academy of Sciences, 2018.
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