Conduction Mechanisms on High Retention Annealed MgO-based Resistive Switching Memory Devices

Abstract We report on the conduction mechanisms of novel Ru/MgO/Cu and Ru/MgO/Ta resistive switching memory (RSM) devices. Current-voltage (I–V) measurements revealed Schottky emission (SE) as the dominant conduction mechanism in the high resistance state (HRS), which was validated by varying temper...

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Bibliographic Details
Main Authors: D. J. J. Loy, P. A. Dananjaya, X. L. Hong, D. P. Shum, W. S. Lew
Format: article
Language:EN
Published: Nature Portfolio 2018
Subjects:
R
Q
Online Access:https://doaj.org/article/1b6f9e51bf60453ea153bdeba152b645
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