Novel Boosting Scheme Using Asymmetric Pass Voltage for Reducing Program Disturbance in 3-Dimensional NAND Flash Memory

In this paper, novel boosting scheme using asymmetric pass voltage (<inline-formula> <tex-math notation="LaTeX">$\text{V}_{\mathrm{ pass}}$ </tex-math></inline-formula>) is proposed to obtain high channel boosting potential and to reduce program disturbance in 3-D N...

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Autores principales: Dae Woong Kwon, Junil Lee, Sihyun Kim, Ryoongbin Lee, Sangwan Kim, Jong-Ho Lee, Byung-Gook Park
Formato: article
Lenguaje:EN
Publicado: IEEE 2018
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Acceso en línea:https://doaj.org/article/1cbf20fdf1714e2684c1801d4c0dbd6f
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