Hot-carrier dynamics in InAs/AlAsSb multiple-quantum wells
Abstract A type-II InAs/AlAs $$_{0.16}$$ 0.16 Sb $$_{0.84}$$ 0.84 multiple-quantum well sample is investigated for the photoexcited carrier dynamics as a function of excitation photon energy and lattice temperature. Time-resolved measurements are performed using a near-infrared pump pulse, with phot...
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| Autores principales: | , , , , , , , |
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| Formato: | article |
| Lenguaje: | EN |
| Publicado: |
Nature Portfolio
2021
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| Materias: | |
| Acceso en línea: | https://doaj.org/article/1e99a58daf5f4b2d84974319b684905e |
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| Sumario: | Abstract A type-II InAs/AlAs $$_{0.16}$$ 0.16 Sb $$_{0.84}$$ 0.84 multiple-quantum well sample is investigated for the photoexcited carrier dynamics as a function of excitation photon energy and lattice temperature. Time-resolved measurements are performed using a near-infrared pump pulse, with photon energies near to and above the band gap, probed with a terahertz probe pulse. The transient terahertz absorption is characterized by a multi-rise, multi-decay function that captures long-lived decay times and a metastable state for an excess-photon energy of $$>100$$ > 100 meV. For sufficient excess-photon energy, excitation of the metastable state is followed by a transition to the long-lived states. Excitation dependence of the long-lived states map onto a nearly-direct band gap ( $$E{_g}$$ E g ) density of states with an Urbach tail below $$E{_g}$$ E g . As temperature increases, the long-lived decay times increase $$<E{_g}$$ < E g , due to the increased phonon interaction of the unintentional defect states, and by phonon stabilization of the hot carriers $$>E{_g}$$ > E g . Additionally, Auger (and/or trap-assisted Auger) scattering above the onset of the plateau may also contribute to longer hot-carrier lifetimes. Meanwhile, the initial decay component shows strong dependence on excitation energy and temperature, reflecting the complicated initial transfer of energy between valence-band and defect states, indicating methods to further prolong hot carriers for technological applications. |
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