Controlling metal–insulator transitions in reactively sputtered vanadium sesquioxide thin films through structure and stoichiometry

Abstract We present a study of $$\hbox {V}_{2}\hbox {O}_{3}$$ V 2 O 3 thin films grown on c-plane $$\hbox {Al}_{2}\hbox {O}_{3}$$ Al 2 O 3 substrates by reactive dc-magnetron sputtering. Our results reveal three distinct types of films displaying different metal–insulator transitions dependent on th...

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Autores principales: Einar B. Thorsteinsson, Seyedmohammad Shayestehaminzadeh, Arni S. Ingason, Fridrik Magnus, Unnar B. Arnalds
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Publicado: Nature Portfolio 2021
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Acceso en línea:https://doaj.org/article/21dae9c769ee4398b08ae941fffd0357
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spelling oai:doaj.org-article:21dae9c769ee4398b08ae941fffd03572021-12-02T16:31:17ZControlling metal–insulator transitions in reactively sputtered vanadium sesquioxide thin films through structure and stoichiometry10.1038/s41598-021-85397-x2045-2322https://doaj.org/article/21dae9c769ee4398b08ae941fffd03572021-03-01T00:00:00Zhttps://doi.org/10.1038/s41598-021-85397-xhttps://doaj.org/toc/2045-2322Abstract We present a study of $$\hbox {V}_{2}\hbox {O}_{3}$$ V 2 O 3 thin films grown on c-plane $$\hbox {Al}_{2}\hbox {O}_{3}$$ Al 2 O 3 substrates by reactive dc-magnetron sputtering. Our results reveal three distinct types of films displaying different metal–insulator transitions dependent on the growth conditions. We observe a clear temperature window, spanning 200 $$^{\circ }$$ ∘ C, where highly epitaxial films of $$\hbox {V}_{2}\hbox {O}_{3}$$ V 2 O 3 can be obtained wherein the transition can be tuned by controlling the amount of interstitial oxygen in the films through the deposition conditions. Although small structural variations are observed within this window, large differences are observed in the electrical properties of the films with strong differences in the magnitude and temperature of the metal–insulator transition which we attribute to small changes in the stoichiometry and local strain in the films. Altering the sputtering power we are able to tune the characteristics of the metal–insulator transition suppressing and shifting the transition to lower temperatures as the power is reduced. Combined results for all the films fabricated for the study show a preferential increase in the a lattice parameter and reduction in the c lattice parameter with reduced deposition temperature with the film deviating from a constant volume unit cell to a higher volume.Einar B. ThorsteinssonSeyedmohammad ShayestehaminzadehArni S. IngasonFridrik MagnusUnnar B. ArnaldsNature PortfolioarticleMedicineRScienceQENScientific Reports, Vol 11, Iss 1, Pp 1-10 (2021)
institution DOAJ
collection DOAJ
language EN
topic Medicine
R
Science
Q
spellingShingle Medicine
R
Science
Q
Einar B. Thorsteinsson
Seyedmohammad Shayestehaminzadeh
Arni S. Ingason
Fridrik Magnus
Unnar B. Arnalds
Controlling metal–insulator transitions in reactively sputtered vanadium sesquioxide thin films through structure and stoichiometry
description Abstract We present a study of $$\hbox {V}_{2}\hbox {O}_{3}$$ V 2 O 3 thin films grown on c-plane $$\hbox {Al}_{2}\hbox {O}_{3}$$ Al 2 O 3 substrates by reactive dc-magnetron sputtering. Our results reveal three distinct types of films displaying different metal–insulator transitions dependent on the growth conditions. We observe a clear temperature window, spanning 200 $$^{\circ }$$ ∘ C, where highly epitaxial films of $$\hbox {V}_{2}\hbox {O}_{3}$$ V 2 O 3 can be obtained wherein the transition can be tuned by controlling the amount of interstitial oxygen in the films through the deposition conditions. Although small structural variations are observed within this window, large differences are observed in the electrical properties of the films with strong differences in the magnitude and temperature of the metal–insulator transition which we attribute to small changes in the stoichiometry and local strain in the films. Altering the sputtering power we are able to tune the characteristics of the metal–insulator transition suppressing and shifting the transition to lower temperatures as the power is reduced. Combined results for all the films fabricated for the study show a preferential increase in the a lattice parameter and reduction in the c lattice parameter with reduced deposition temperature with the film deviating from a constant volume unit cell to a higher volume.
format article
author Einar B. Thorsteinsson
Seyedmohammad Shayestehaminzadeh
Arni S. Ingason
Fridrik Magnus
Unnar B. Arnalds
author_facet Einar B. Thorsteinsson
Seyedmohammad Shayestehaminzadeh
Arni S. Ingason
Fridrik Magnus
Unnar B. Arnalds
author_sort Einar B. Thorsteinsson
title Controlling metal–insulator transitions in reactively sputtered vanadium sesquioxide thin films through structure and stoichiometry
title_short Controlling metal–insulator transitions in reactively sputtered vanadium sesquioxide thin films through structure and stoichiometry
title_full Controlling metal–insulator transitions in reactively sputtered vanadium sesquioxide thin films through structure and stoichiometry
title_fullStr Controlling metal–insulator transitions in reactively sputtered vanadium sesquioxide thin films through structure and stoichiometry
title_full_unstemmed Controlling metal–insulator transitions in reactively sputtered vanadium sesquioxide thin films through structure and stoichiometry
title_sort controlling metal–insulator transitions in reactively sputtered vanadium sesquioxide thin films through structure and stoichiometry
publisher Nature Portfolio
publishDate 2021
url https://doaj.org/article/21dae9c769ee4398b08ae941fffd0357
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