Robust ultraclean atomically thin membranes for atomic-resolution electron microscopy

High-resolution electron microscopy requires robust and noise-free substrates to support the specimens. Here, the authors present a polymer- and transfer-free direct-etching method for fabrication of graphene grids with ultraclean surfaces and demonstrate cryo-EM at record high resolution.

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Autores principales:	Liming Zheng, Yanan Chen, Ning Li, Jincan Zhang, Nan Liu, Junjie Liu, Wenhui Dang, Bing Deng, Yanbin Li, Xiaoyin Gao, Congwei Tan, Zi Yang, Shipu Xu, Mingzhan Wang, Hao Yang, Luzhao Sun, Yi Cui, Xiaoding Wei, Peng Gao, Hong-Wei Wang, Hailin Peng
Formato:	article
Lenguaje:	EN
Publicado:	Nature Portfolio 2020
Materias:	Science Q
Acceso en línea:	https://doaj.org/article/21e324f9a2ec46f5a54c75ba82aa65b2
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spelling	oai:doaj.org-article:21e324f9a2ec46f5a54c75ba82aa65b22021-12-02T16:50:01ZRobust ultraclean atomically thin membranes for atomic-resolution electron microscopy10.1038/s41467-020-14359-02041-1723https://doaj.org/article/21e324f9a2ec46f5a54c75ba82aa65b22020-01-01T00:00:00Zhttps://doi.org/10.1038/s41467-020-14359-0https://doaj.org/toc/2041-1723High-resolution electron microscopy requires robust and noise-free substrates to support the specimens. Here, the authors present a polymer- and transfer-free direct-etching method for fabrication of graphene grids with ultraclean surfaces and demonstrate cryo-EM at record high resolution.Liming ZhengYanan ChenNing LiJincan ZhangNan LiuJunjie LiuWenhui DangBing DengYanbin LiXiaoyin GaoCongwei TanZi YangShipu XuMingzhan WangHao YangLuzhao SunYi CuiXiaoding WeiPeng GaoHong-Wei WangHailin PengNature PortfolioarticleScienceQENNature Communications, Vol 11, Iss 1, Pp 1-8 (2020)
institution	DOAJ
collection	DOAJ
language	EN
topic	Science Q
spellingShingle	Science Q Liming Zheng Yanan Chen Ning Li Jincan Zhang Nan Liu Junjie Liu Wenhui Dang Bing Deng Yanbin Li Xiaoyin Gao Congwei Tan Zi Yang Shipu Xu Mingzhan Wang Hao Yang Luzhao Sun Yi Cui Xiaoding Wei Peng Gao Hong-Wei Wang Hailin Peng Robust ultraclean atomically thin membranes for atomic-resolution electron microscopy
description	High-resolution electron microscopy requires robust and noise-free substrates to support the specimens. Here, the authors present a polymer- and transfer-free direct-etching method for fabrication of graphene grids with ultraclean surfaces and demonstrate cryo-EM at record high resolution.
format	article
author	Liming Zheng Yanan Chen Ning Li Jincan Zhang Nan Liu Junjie Liu Wenhui Dang Bing Deng Yanbin Li Xiaoyin Gao Congwei Tan Zi Yang Shipu Xu Mingzhan Wang Hao Yang Luzhao Sun Yi Cui Xiaoding Wei Peng Gao Hong-Wei Wang Hailin Peng
author_facet	Liming Zheng Yanan Chen Ning Li Jincan Zhang Nan Liu Junjie Liu Wenhui Dang Bing Deng Yanbin Li Xiaoyin Gao Congwei Tan Zi Yang Shipu Xu Mingzhan Wang Hao Yang Luzhao Sun Yi Cui Xiaoding Wei Peng Gao Hong-Wei Wang Hailin Peng
author_sort	Liming Zheng
title	Robust ultraclean atomically thin membranes for atomic-resolution electron microscopy
title_short	Robust ultraclean atomically thin membranes for atomic-resolution electron microscopy
title_full	Robust ultraclean atomically thin membranes for atomic-resolution electron microscopy
title_fullStr	Robust ultraclean atomically thin membranes for atomic-resolution electron microscopy
title_full_unstemmed	Robust ultraclean atomically thin membranes for atomic-resolution electron microscopy
title_sort	robust ultraclean atomically thin membranes for atomic-resolution electron microscopy
publisher	Nature Portfolio
publishDate	2020
url	https://doaj.org/article/21e324f9a2ec46f5a54c75ba82aa65b2
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Robust ultraclean atomically thin membranes for atomic-resolution electron microscopy

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