Robust ultraclean atomically thin membranes for atomic-resolution electron microscopy

Robust ultraclean atomically thin membranes for atomic-resolution electron microscopy

High-resolution electron microscopy requires robust and noise-free substrates to support the specimens. Here, the authors present a polymer- and transfer-free direct-etching method for fabrication of graphene grids with ultraclean surfaces and demonstrate cryo-EM at record high resolution.

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Auteurs principaux: Liming Zheng, Yanan Chen, Ning Li, Jincan Zhang, Nan Liu, Junjie Liu, Wenhui Dang, Bing Deng, Yanbin Li, Xiaoyin Gao, Congwei Tan, Zi Yang, Shipu Xu, Mingzhan Wang, Hao Yang, Luzhao Sun, Yi Cui, Xiaoding Wei, Peng Gao, Hong-Wei Wang, Hailin Peng
Format: article
Langue:EN
Publié: Nature Portfolio 2020
Sujets:
Science
Q
Accès en ligne:https://doaj.org/article/21e324f9a2ec46f5a54c75ba82aa65b2
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Internet

https://doaj.org/article/21e324f9a2ec46f5a54c75ba82aa65b2

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