Electrode interface optimization advances conversion efficiency and stability of thermoelectric devices

Long-term service stability of thermoelectric devices is one of the major obstacles for their application. Here, the authors combine interfacial reaction energy and Sb migration activation energy barrier as a criterion to determine the interfacial reliability for skutterudite thermoelectric devices.

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Autores principales:	Jing Chu, Jian Huang, Ruiheng Liu, Jincheng Liao, Xugui Xia, Qihao Zhang, Chao Wang, Ming Gu, Shengqiang Bai, Xun Shi, Lidong Chen
Formato:	article
Lenguaje:	EN
Publicado:	Nature Portfolio 2020
Materias:	Science Q
Acceso en línea:	https://doaj.org/article/2533e6864dea4af8a23c6c4e5778f2e0
Etiquetas:	Agregar Etiqueta Sin Etiquetas, Sea el primero en etiquetar este registro!

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spelling	oai:doaj.org-article:2533e6864dea4af8a23c6c4e5778f2e02021-12-02T15:57:19ZElectrode interface optimization advances conversion efficiency and stability of thermoelectric devices10.1038/s41467-020-16508-x2041-1723https://doaj.org/article/2533e6864dea4af8a23c6c4e5778f2e02020-06-01T00:00:00Zhttps://doi.org/10.1038/s41467-020-16508-xhttps://doaj.org/toc/2041-1723Long-term service stability of thermoelectric devices is one of the major obstacles for their application. Here, the authors combine interfacial reaction energy and Sb migration activation energy barrier as a criterion to determine the interfacial reliability for skutterudite thermoelectric devices.Jing ChuJian HuangRuiheng LiuJincheng LiaoXugui XiaQihao ZhangChao WangMing GuShengqiang BaiXun ShiLidong ChenNature PortfolioarticleScienceQENNature Communications, Vol 11, Iss 1, Pp 1-8 (2020)
institution	DOAJ
collection	DOAJ
language	EN
topic	Science Q
spellingShingle	Science Q Jing Chu Jian Huang Ruiheng Liu Jincheng Liao Xugui Xia Qihao Zhang Chao Wang Ming Gu Shengqiang Bai Xun Shi Lidong Chen Electrode interface optimization advances conversion efficiency and stability of thermoelectric devices
description	Long-term service stability of thermoelectric devices is one of the major obstacles for their application. Here, the authors combine interfacial reaction energy and Sb migration activation energy barrier as a criterion to determine the interfacial reliability for skutterudite thermoelectric devices.
format	article
author	Jing Chu Jian Huang Ruiheng Liu Jincheng Liao Xugui Xia Qihao Zhang Chao Wang Ming Gu Shengqiang Bai Xun Shi Lidong Chen
author_facet	Jing Chu Jian Huang Ruiheng Liu Jincheng Liao Xugui Xia Qihao Zhang Chao Wang Ming Gu Shengqiang Bai Xun Shi Lidong Chen
author_sort	Jing Chu
title	Electrode interface optimization advances conversion efficiency and stability of thermoelectric devices
title_short	Electrode interface optimization advances conversion efficiency and stability of thermoelectric devices
title_full	Electrode interface optimization advances conversion efficiency and stability of thermoelectric devices
title_fullStr	Electrode interface optimization advances conversion efficiency and stability of thermoelectric devices
title_full_unstemmed	Electrode interface optimization advances conversion efficiency and stability of thermoelectric devices
title_sort	electrode interface optimization advances conversion efficiency and stability of thermoelectric devices
publisher	Nature Portfolio
publishDate	2020
url	https://doaj.org/article/2533e6864dea4af8a23c6c4e5778f2e0
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_version_	1718385318516752384

Electrode interface optimization advances conversion efficiency and stability of thermoelectric devices

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