Electrode interface optimization advances conversion efficiency and stability of thermoelectric devices
Long-term service stability of thermoelectric devices is one of the major obstacles for their application. Here, the authors combine interfacial reaction energy and Sb migration activation energy barrier as a criterion to determine the interfacial reliability for skutterudite thermoelectric devices.
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| Autores principales: | , , , , , , , , , , |
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| Formato: | article |
| Lenguaje: | EN |
| Publicado: |
Nature Portfolio
2020
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| Materias: | |
| Acceso en línea: | https://doaj.org/article/2533e6864dea4af8a23c6c4e5778f2e0 |
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