Tribological Properties of LB films Measured under Zero Applied Load
We examined the pull-off and friction forces between an atomic force microscope (AFM) probe and submicron-scale asperities covered with Langmuir Blodgett (LB) films. First, we used a focused ion beam to produce several kinds of asperity arrays on two silicon substrates. The average radius of curvatu...
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| Main Authors: | , , |
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| Format: | article |
| Language: | EN |
| Published: |
Japanese Society of Tribologists
2007
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| Subjects: | |
| Online Access: | https://doaj.org/article/25b6a27def9d4ccfa524aa4b61890732 |
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