Piezo-generated charge mapping revealed through direct piezoelectric force microscopy

Piezoelectrics and ferroelectrics are important for everyday applications, but methods to characterize these materials at the nanoscale are lacking. Here the authors present direct piezoelectric force microscopy, an AFM mode that can measure charges generated by the direct piezoelectric effect with...

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Autores principales:	A. Gomez, M. Gich, A. Carretero-Genevrier, T. Puig, X. Obradors
Formato:	article
Lenguaje:	EN
Publicado:	Nature Portfolio 2017
Materias:	Science Q
Acceso en línea:	https://doaj.org/article/2bc572c9c4df4c1daf0fc324b33d1875
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spelling	oai:doaj.org-article:2bc572c9c4df4c1daf0fc324b33d18752021-12-02T15:38:42ZPiezo-generated charge mapping revealed through direct piezoelectric force microscopy10.1038/s41467-017-01361-22041-1723https://doaj.org/article/2bc572c9c4df4c1daf0fc324b33d18752017-10-01T00:00:00Zhttps://doi.org/10.1038/s41467-017-01361-2https://doaj.org/toc/2041-1723Piezoelectrics and ferroelectrics are important for everyday applications, but methods to characterize these materials at the nanoscale are lacking. Here the authors present direct piezoelectric force microscopy, an AFM mode that can measure charges generated by the direct piezoelectric effect with nanoscale resolution.A. GomezM. GichA. Carretero-GenevrierT. PuigX. ObradorsNature PortfolioarticleScienceQENNature Communications, Vol 8, Iss 1, Pp 1-10 (2017)
institution	DOAJ
collection	DOAJ
language	EN
topic	Science Q
spellingShingle	Science Q A. Gomez M. Gich A. Carretero-Genevrier T. Puig X. Obradors Piezo-generated charge mapping revealed through direct piezoelectric force microscopy
description	Piezoelectrics and ferroelectrics are important for everyday applications, but methods to characterize these materials at the nanoscale are lacking. Here the authors present direct piezoelectric force microscopy, an AFM mode that can measure charges generated by the direct piezoelectric effect with nanoscale resolution.
format	article
author	A. Gomez M. Gich A. Carretero-Genevrier T. Puig X. Obradors
author_facet	A. Gomez M. Gich A. Carretero-Genevrier T. Puig X. Obradors
author_sort	A. Gomez
title	Piezo-generated charge mapping revealed through direct piezoelectric force microscopy
title_short	Piezo-generated charge mapping revealed through direct piezoelectric force microscopy
title_full	Piezo-generated charge mapping revealed through direct piezoelectric force microscopy
title_fullStr	Piezo-generated charge mapping revealed through direct piezoelectric force microscopy
title_full_unstemmed	Piezo-generated charge mapping revealed through direct piezoelectric force microscopy
title_sort	piezo-generated charge mapping revealed through direct piezoelectric force microscopy
publisher	Nature Portfolio
publishDate	2017
url	https://doaj.org/article/2bc572c9c4df4c1daf0fc324b33d1875
work_keys_str_mv	AT agomez piezogeneratedchargemappingrevealedthroughdirectpiezoelectricforcemicroscopy AT mgich piezogeneratedchargemappingrevealedthroughdirectpiezoelectricforcemicroscopy AT acarreterogenevrier piezogeneratedchargemappingrevealedthroughdirectpiezoelectricforcemicroscopy AT tpuig piezogeneratedchargemappingrevealedthroughdirectpiezoelectricforcemicroscopy AT xobradors piezogeneratedchargemappingrevealedthroughdirectpiezoelectricforcemicroscopy
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Piezo-generated charge mapping revealed through direct piezoelectric force microscopy

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