A Novel Detection Method for Acoustic Emission Using a Scanning Probe Microscope

The fracture of the atomic-scale contact should be investigated for understanding the mechanism of the mechanical processing. Using a combination of the scanning probe microscope (SPM) with possible high space resolution and the acoustic emission (AE) with high sensitivity for fracture is one of the...

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Autores principales: Satoru Fujisawa, Hiroki Mano, Koji Miyake
Formato: article
Lenguaje:EN
Publicado: Japanese Society of Tribologists 2016
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spelling oai:doaj.org-article:2bf0de4fb02a44838efe264ad52c2ccd2021-11-05T09:21:03ZA Novel Detection Method for Acoustic Emission Using a Scanning Probe Microscope1881-219810.2474/trol.11.646https://doaj.org/article/2bf0de4fb02a44838efe264ad52c2ccd2016-10-01T00:00:00Zhttps://www.jstage.jst.go.jp/article/trol/11/6/11_646/_pdf/-char/enhttps://doaj.org/toc/1881-2198The fracture of the atomic-scale contact should be investigated for understanding the mechanism of the mechanical processing. Using a combination of the scanning probe microscope (SPM) with possible high space resolution and the acoustic emission (AE) with high sensitivity for fracture is one of the possible way of investigating the fracture mechanism. When using the SPM, the AE signal might be detected with receiving the AE wave by the piezoelectric tube scanner of the SPM receiving the AE wave, where by the piezoelectric effect the electric signal due to the AE wave is superimposed on the scan signal. Based on that, in this study, a novel method to detect AE signal from the scan signal is proposed. With this method, without changing the SPM body, the AE could be detected, and a two-dimensional AE source location could be possible by using four divided electrodes of the piezoelectric tube scanner. By a simple experiment using the AE wave simulator, the AE signal seems to be detected by the piezoelectric scanner of the SPM. Also, one of the typical data from the experiment suggests the AE source location might be possible. In the experiment of the indentation using atomic force microscope (AFM), which is one of the SPM, the AE signal is observed reproducibly.Satoru FujisawaHiroki ManoKoji MiyakeJapanese Society of Tribologistsarticlemechanical processingfracture mechanics, scanning probe microscope (spm)acoustic emission (ae)piezoelectrictube scannerscan signalhigh pass filtertwo-dimensional ae source locationPhysicsQC1-999Engineering (General). Civil engineering (General)TA1-2040Mechanical engineering and machineryTJ1-1570ChemistryQD1-999ENTribology Online, Vol 11, Iss 6, Pp 646-652 (2016)
institution DOAJ
collection DOAJ
language EN
topic mechanical processing
fracture mechanics, scanning probe microscope (spm)
acoustic emission (ae)
piezoelectric
tube scanner
scan signal
high pass filter
two-dimensional ae source location
Physics
QC1-999
Engineering (General). Civil engineering (General)
TA1-2040
Mechanical engineering and machinery
TJ1-1570
Chemistry
QD1-999
spellingShingle mechanical processing
fracture mechanics, scanning probe microscope (spm)
acoustic emission (ae)
piezoelectric
tube scanner
scan signal
high pass filter
two-dimensional ae source location
Physics
QC1-999
Engineering (General). Civil engineering (General)
TA1-2040
Mechanical engineering and machinery
TJ1-1570
Chemistry
QD1-999
Satoru Fujisawa
Hiroki Mano
Koji Miyake
A Novel Detection Method for Acoustic Emission Using a Scanning Probe Microscope
description The fracture of the atomic-scale contact should be investigated for understanding the mechanism of the mechanical processing. Using a combination of the scanning probe microscope (SPM) with possible high space resolution and the acoustic emission (AE) with high sensitivity for fracture is one of the possible way of investigating the fracture mechanism. When using the SPM, the AE signal might be detected with receiving the AE wave by the piezoelectric tube scanner of the SPM receiving the AE wave, where by the piezoelectric effect the electric signal due to the AE wave is superimposed on the scan signal. Based on that, in this study, a novel method to detect AE signal from the scan signal is proposed. With this method, without changing the SPM body, the AE could be detected, and a two-dimensional AE source location could be possible by using four divided electrodes of the piezoelectric tube scanner. By a simple experiment using the AE wave simulator, the AE signal seems to be detected by the piezoelectric scanner of the SPM. Also, one of the typical data from the experiment suggests the AE source location might be possible. In the experiment of the indentation using atomic force microscope (AFM), which is one of the SPM, the AE signal is observed reproducibly.
format article
author Satoru Fujisawa
Hiroki Mano
Koji Miyake
author_facet Satoru Fujisawa
Hiroki Mano
Koji Miyake
author_sort Satoru Fujisawa
title A Novel Detection Method for Acoustic Emission Using a Scanning Probe Microscope
title_short A Novel Detection Method for Acoustic Emission Using a Scanning Probe Microscope
title_full A Novel Detection Method for Acoustic Emission Using a Scanning Probe Microscope
title_fullStr A Novel Detection Method for Acoustic Emission Using a Scanning Probe Microscope
title_full_unstemmed A Novel Detection Method for Acoustic Emission Using a Scanning Probe Microscope
title_sort novel detection method for acoustic emission using a scanning probe microscope
publisher Japanese Society of Tribologists
publishDate 2016
url https://doaj.org/article/2bf0de4fb02a44838efe264ad52c2ccd
work_keys_str_mv AT satorufujisawa anoveldetectionmethodforacousticemissionusingascanningprobemicroscope
AT hirokimano anoveldetectionmethodforacousticemissionusingascanningprobemicroscope
AT kojimiyake anoveldetectionmethodforacousticemissionusingascanningprobemicroscope
AT satorufujisawa noveldetectionmethodforacousticemissionusingascanningprobemicroscope
AT hirokimano noveldetectionmethodforacousticemissionusingascanningprobemicroscope
AT kojimiyake noveldetectionmethodforacousticemissionusingascanningprobemicroscope
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