Reproducible flaws unveil electrostatic aspects of semiconductor electrochemistry

Most electrical devices must pass charges across semiconductor interfaces, yet redox-active molecular behavior obscures comprehension of these processes. Here, the authors develop a model to describe redox processes on semiconductor surfaces and gauge these interactions electrochemically.

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Autores principales: Yan B. Vogel, Long Zhang, Nadim Darwish, Vinicius R. Gonçales, Anton Le Brun, J. Justin Gooding, Angela Molina, Gordon G. Wallace, Michelle L. Coote, Joaquin Gonzalez, Simone Ciampi
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Lenguaje:EN
Publicado: Nature Portfolio 2017
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Acceso en línea:https://doaj.org/article/2f2c2919284f4364adf2a3836f4c676e
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spelling oai:doaj.org-article:2f2c2919284f4364adf2a3836f4c676e2021-12-02T15:38:53ZReproducible flaws unveil electrostatic aspects of semiconductor electrochemistry10.1038/s41467-017-02091-12041-1723https://doaj.org/article/2f2c2919284f4364adf2a3836f4c676e2017-12-01T00:00:00Zhttps://doi.org/10.1038/s41467-017-02091-1https://doaj.org/toc/2041-1723Most electrical devices must pass charges across semiconductor interfaces, yet redox-active molecular behavior obscures comprehension of these processes. Here, the authors develop a model to describe redox processes on semiconductor surfaces and gauge these interactions electrochemically.Yan B. VogelLong ZhangNadim DarwishVinicius R. GonçalesAnton Le BrunJ. Justin GoodingAngela MolinaGordon G. WallaceMichelle L. CooteJoaquin GonzalezSimone CiampiNature PortfolioarticleScienceQENNature Communications, Vol 8, Iss 1, Pp 1-9 (2017)
institution DOAJ
collection DOAJ
language EN
topic Science
Q
spellingShingle Science
Q
Yan B. Vogel
Long Zhang
Nadim Darwish
Vinicius R. Gonçales
Anton Le Brun
J. Justin Gooding
Angela Molina
Gordon G. Wallace
Michelle L. Coote
Joaquin Gonzalez
Simone Ciampi
Reproducible flaws unveil electrostatic aspects of semiconductor electrochemistry
description Most electrical devices must pass charges across semiconductor interfaces, yet redox-active molecular behavior obscures comprehension of these processes. Here, the authors develop a model to describe redox processes on semiconductor surfaces and gauge these interactions electrochemically.
format article
author Yan B. Vogel
Long Zhang
Nadim Darwish
Vinicius R. Gonçales
Anton Le Brun
J. Justin Gooding
Angela Molina
Gordon G. Wallace
Michelle L. Coote
Joaquin Gonzalez
Simone Ciampi
author_facet Yan B. Vogel
Long Zhang
Nadim Darwish
Vinicius R. Gonçales
Anton Le Brun
J. Justin Gooding
Angela Molina
Gordon G. Wallace
Michelle L. Coote
Joaquin Gonzalez
Simone Ciampi
author_sort Yan B. Vogel
title Reproducible flaws unveil electrostatic aspects of semiconductor electrochemistry
title_short Reproducible flaws unveil electrostatic aspects of semiconductor electrochemistry
title_full Reproducible flaws unveil electrostatic aspects of semiconductor electrochemistry
title_fullStr Reproducible flaws unveil electrostatic aspects of semiconductor electrochemistry
title_full_unstemmed Reproducible flaws unveil electrostatic aspects of semiconductor electrochemistry
title_sort reproducible flaws unveil electrostatic aspects of semiconductor electrochemistry
publisher Nature Portfolio
publishDate 2017
url https://doaj.org/article/2f2c2919284f4364adf2a3836f4c676e
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