Quantification of porosity in extensively nanoporous thin films in contact with gases and liquids

Thin porous layers are largely used, but a reliable method to quantify their porosity is missing. Here the authors demonstrate a method, based on quartz crystal microbalance measurements with dissipation monitoring, for accurate assessment of porosity and mechanical properties in thin porous films.

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Detalles Bibliográficos
Autores principales: Netanel Shpigel, Sergey Sigalov, Fyodor Malchik, Mikhael D. Levi, Olga Girshevitz, Rafail L. Khalfin, Doron Aurbach
Formato: article
Lenguaje:EN
Publicado: Nature Portfolio 2019
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Acceso en línea:https://doaj.org/article/2fcb27a0f1e248cfaa28dcd2484b7ad9
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Sumario:Thin porous layers are largely used, but a reliable method to quantify their porosity is missing. Here the authors demonstrate a method, based on quartz crystal microbalance measurements with dissipation monitoring, for accurate assessment of porosity and mechanical properties in thin porous films.