Quantification of porosity in extensively nanoporous thin films in contact with gases and liquids
Thin porous layers are largely used, but a reliable method to quantify their porosity is missing. Here the authors demonstrate a method, based on quartz crystal microbalance measurements with dissipation monitoring, for accurate assessment of porosity and mechanical properties in thin porous films.
Guardado en:
Autores principales: | Netanel Shpigel, Sergey Sigalov, Fyodor Malchik, Mikhael D. Levi, Olga Girshevitz, Rafail L. Khalfin, Doron Aurbach |
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Formato: | article |
Lenguaje: | EN |
Publicado: |
Nature Portfolio
2019
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Materias: | |
Acceso en línea: | https://doaj.org/article/2fcb27a0f1e248cfaa28dcd2484b7ad9 |
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