Automatic Unsupervised Fabric Defect Detection Based on Self-Feature Comparison

Due to the huge demand for textile production in China, fabric defect detection is particularly attractive. At present, an increasing number of supervised deep-learning methods are being applied in surface defect detection. However, the annotation of datasets in industrial settings often depends on...

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Autores principales: Zhengrui Peng, Xinyi Gong, Bengang Wei, Xiangyi Xu, Shixiong Meng
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Lenguaje:EN
Publicado: MDPI AG 2021
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Acceso en línea:https://doaj.org/article/31b7c9e6f72c4afaab16d01da69f689b
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spelling oai:doaj.org-article:31b7c9e6f72c4afaab16d01da69f689b2021-11-11T15:39:18ZAutomatic Unsupervised Fabric Defect Detection Based on Self-Feature Comparison10.3390/electronics102126522079-9292https://doaj.org/article/31b7c9e6f72c4afaab16d01da69f689b2021-10-01T00:00:00Zhttps://www.mdpi.com/2079-9292/10/21/2652https://doaj.org/toc/2079-9292Due to the huge demand for textile production in China, fabric defect detection is particularly attractive. At present, an increasing number of supervised deep-learning methods are being applied in surface defect detection. However, the annotation of datasets in industrial settings often depends on professional inspectors. Moreover, the methods based on supervised learning require a lot of annotation, which consumes a great deal of time and costs. In this paper, an approach based on self-feature comparison (SFC) was employed that accurately located and segmented fabric texture images to find anomalies with unsupervised learning. The SFC architecture contained the self-feature reconstruction module and the self-feature distillation. Accurate fiber anomaly location and segmentation were generated based on these two modules. Compared with the traditional methods that operate in image space, the comparison of feature space can better locate the anomalies of fiber texture surfaces. Evaluations were performed on the three publicly available databases. The results indicated that our method performed well compared with other methods, and had excellent defect detection ability in the collected textile images. In addition, the visual results showed that our results can be used as a pixel-level candidate label.Zhengrui PengXinyi GongBengang WeiXiangyi XuShixiong MengMDPI AGarticlefabric defectunsupervised learningcomputer visiondeep learningElectronicsTK7800-8360ENElectronics, Vol 10, Iss 2652, p 2652 (2021)
institution DOAJ
collection DOAJ
language EN
topic fabric defect
unsupervised learning
computer vision
deep learning
Electronics
TK7800-8360
spellingShingle fabric defect
unsupervised learning
computer vision
deep learning
Electronics
TK7800-8360
Zhengrui Peng
Xinyi Gong
Bengang Wei
Xiangyi Xu
Shixiong Meng
Automatic Unsupervised Fabric Defect Detection Based on Self-Feature Comparison
description Due to the huge demand for textile production in China, fabric defect detection is particularly attractive. At present, an increasing number of supervised deep-learning methods are being applied in surface defect detection. However, the annotation of datasets in industrial settings often depends on professional inspectors. Moreover, the methods based on supervised learning require a lot of annotation, which consumes a great deal of time and costs. In this paper, an approach based on self-feature comparison (SFC) was employed that accurately located and segmented fabric texture images to find anomalies with unsupervised learning. The SFC architecture contained the self-feature reconstruction module and the self-feature distillation. Accurate fiber anomaly location and segmentation were generated based on these two modules. Compared with the traditional methods that operate in image space, the comparison of feature space can better locate the anomalies of fiber texture surfaces. Evaluations were performed on the three publicly available databases. The results indicated that our method performed well compared with other methods, and had excellent defect detection ability in the collected textile images. In addition, the visual results showed that our results can be used as a pixel-level candidate label.
format article
author Zhengrui Peng
Xinyi Gong
Bengang Wei
Xiangyi Xu
Shixiong Meng
author_facet Zhengrui Peng
Xinyi Gong
Bengang Wei
Xiangyi Xu
Shixiong Meng
author_sort Zhengrui Peng
title Automatic Unsupervised Fabric Defect Detection Based on Self-Feature Comparison
title_short Automatic Unsupervised Fabric Defect Detection Based on Self-Feature Comparison
title_full Automatic Unsupervised Fabric Defect Detection Based on Self-Feature Comparison
title_fullStr Automatic Unsupervised Fabric Defect Detection Based on Self-Feature Comparison
title_full_unstemmed Automatic Unsupervised Fabric Defect Detection Based on Self-Feature Comparison
title_sort automatic unsupervised fabric defect detection based on self-feature comparison
publisher MDPI AG
publishDate 2021
url https://doaj.org/article/31b7c9e6f72c4afaab16d01da69f689b
work_keys_str_mv AT zhengruipeng automaticunsupervisedfabricdefectdetectionbasedonselffeaturecomparison
AT xinyigong automaticunsupervisedfabricdefectdetectionbasedonselffeaturecomparison
AT bengangwei automaticunsupervisedfabricdefectdetectionbasedonselffeaturecomparison
AT xiangyixu automaticunsupervisedfabricdefectdetectionbasedonselffeaturecomparison
AT shixiongmeng automaticunsupervisedfabricdefectdetectionbasedonselffeaturecomparison
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