Suitability of Current Sensors for the Measurement of Switching Currents in Power Semiconductors

This paper investigates the impact of current sensors on the measurement of transient currents in fast-switching power semiconductors in a double pulse test (DPT) environment. We review previous research that assesses the influence of current sensors on a DPT circuit through mathematical modeling. T...

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Autores principales:	Sebastian Sprunck, Christian Lottis, Fabian Schnabel, Marco Jung
Formato:	article
Lenguaje:	EN
Publicado:	IEEE 2021
Materias:	Current measurement double pulse test error analysis measurement errors power semiconductors sensor phenomena and characterization Electrical engineering. Electronics. Nuclear engineering TK1-9971
Acceso en línea:	https://doaj.org/article/3297f36f48bd460d9d214b95aa5b89bf
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spelling	oai:doaj.org-article:3297f36f48bd460d9d214b95aa5b89bf2021-12-01T00:01:50ZSuitability of Current Sensors for the Measurement of Switching Currents in Power Semiconductors2644-131410.1109/OJPEL.2021.3127225https://doaj.org/article/3297f36f48bd460d9d214b95aa5b89bf2021-01-01T00:00:00Zhttps://ieeexplore.ieee.org/document/9612076/https://doaj.org/toc/2644-1314This paper investigates the impact of current sensors on the measurement of transient currents in fast-switching power semiconductors in a double pulse test (DPT) environment. We review previous research that assesses the influence of current sensors on a DPT circuit through mathematical modeling. The developed selection aids can be used to identify suitable current sensors for transient current measurements of fast-switching power semiconductors and to estimate the error introduced by their insertion into the DPT circuit. Afterwards, this analysis is extended by including further elements from real DPT applications to increase the consistency of the error estimation with practical situations and setups. Both methods are compared and their individual advantages and drawbacks are discussed. Finally, a recommendation on when to use which method is derived.Sebastian SprunckChristian LottisFabian SchnabelMarco JungIEEEarticleCurrent measurementdouble pulse testerror analysismeasurement errorspower semiconductorssensor phenomena and characterizationElectrical engineering. Electronics. Nuclear engineeringTK1-9971ENIEEE Open Journal of Power Electronics, Vol 2, Pp 570-581 (2021)
institution	DOAJ
collection	DOAJ
language	EN
topic	Current measurement double pulse test error analysis measurement errors power semiconductors sensor phenomena and characterization Electrical engineering. Electronics. Nuclear engineering TK1-9971
spellingShingle	Current measurement double pulse test error analysis measurement errors power semiconductors sensor phenomena and characterization Electrical engineering. Electronics. Nuclear engineering TK1-9971 Sebastian Sprunck Christian Lottis Fabian Schnabel Marco Jung Suitability of Current Sensors for the Measurement of Switching Currents in Power Semiconductors
description	This paper investigates the impact of current sensors on the measurement of transient currents in fast-switching power semiconductors in a double pulse test (DPT) environment. We review previous research that assesses the influence of current sensors on a DPT circuit through mathematical modeling. The developed selection aids can be used to identify suitable current sensors for transient current measurements of fast-switching power semiconductors and to estimate the error introduced by their insertion into the DPT circuit. Afterwards, this analysis is extended by including further elements from real DPT applications to increase the consistency of the error estimation with practical situations and setups. Both methods are compared and their individual advantages and drawbacks are discussed. Finally, a recommendation on when to use which method is derived.
format	article
author	Sebastian Sprunck Christian Lottis Fabian Schnabel Marco Jung
author_facet	Sebastian Sprunck Christian Lottis Fabian Schnabel Marco Jung
author_sort	Sebastian Sprunck
title	Suitability of Current Sensors for the Measurement of Switching Currents in Power Semiconductors
title_short	Suitability of Current Sensors for the Measurement of Switching Currents in Power Semiconductors
title_full	Suitability of Current Sensors for the Measurement of Switching Currents in Power Semiconductors
title_fullStr	Suitability of Current Sensors for the Measurement of Switching Currents in Power Semiconductors
title_full_unstemmed	Suitability of Current Sensors for the Measurement of Switching Currents in Power Semiconductors
title_sort	suitability of current sensors for the measurement of switching currents in power semiconductors
publisher	IEEE
publishDate	2021
url	https://doaj.org/article/3297f36f48bd460d9d214b95aa5b89bf
work_keys_str_mv	AT sebastiansprunck suitabilityofcurrentsensorsforthemeasurementofswitchingcurrentsinpowersemiconductors AT christianlottis suitabilityofcurrentsensorsforthemeasurementofswitchingcurrentsinpowersemiconductors AT fabianschnabel suitabilityofcurrentsensorsforthemeasurementofswitchingcurrentsinpowersemiconductors AT marcojung suitabilityofcurrentsensorsforthemeasurementofswitchingcurrentsinpowersemiconductors
_version_	1718406131105136640

Suitability of Current Sensors for the Measurement of Switching Currents in Power Semiconductors

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