Possible absence of critical thickness and size effect in ultrathin perovskite ferroelectric films

Understanding ferroelectricity at reduced dimensions will be important for future sub-nanoscale devices based on ferroelectrics. Using high resolution electron microscopy; Gaoet al., observe the existence of a measurable polarization at a thickness of just 1.5-unit cells

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Autores principales: Peng Gao, Zhangyuan Zhang, Mingqiang Li, Ryo Ishikawa, Bin Feng, Heng-Jui Liu, Yen-Lin Huang, Naoya Shibata, Xiumei Ma, Shulin Chen, Jingmin Zhang, Kaihui Liu, En-Ge Wang, Dapeng Yu, Lei Liao, Ying-Hao Chu, Yuichi Ikuhara
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Lenguaje:EN
Publicado: Nature Portfolio 2017
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Acceso en línea:https://doaj.org/article/337d84424ee94563b736d05bd1d5fa1c
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spelling oai:doaj.org-article:337d84424ee94563b736d05bd1d5fa1c2021-12-02T15:38:31ZPossible absence of critical thickness and size effect in ultrathin perovskite ferroelectric films10.1038/ncomms155492041-1723https://doaj.org/article/337d84424ee94563b736d05bd1d5fa1c2017-06-01T00:00:00Zhttps://doi.org/10.1038/ncomms15549https://doaj.org/toc/2041-1723Understanding ferroelectricity at reduced dimensions will be important for future sub-nanoscale devices based on ferroelectrics. Using high resolution electron microscopy; Gaoet al., observe the existence of a measurable polarization at a thickness of just 1.5-unit cellsPeng GaoZhangyuan ZhangMingqiang LiRyo IshikawaBin FengHeng-Jui LiuYen-Lin HuangNaoya ShibataXiumei MaShulin ChenJingmin ZhangKaihui LiuEn-Ge WangDapeng YuLei LiaoYing-Hao ChuYuichi IkuharaNature PortfolioarticleScienceQENNature Communications, Vol 8, Iss 1, Pp 1-8 (2017)
institution DOAJ
collection DOAJ
language EN
topic Science
Q
spellingShingle Science
Q
Peng Gao
Zhangyuan Zhang
Mingqiang Li
Ryo Ishikawa
Bin Feng
Heng-Jui Liu
Yen-Lin Huang
Naoya Shibata
Xiumei Ma
Shulin Chen
Jingmin Zhang
Kaihui Liu
En-Ge Wang
Dapeng Yu
Lei Liao
Ying-Hao Chu
Yuichi Ikuhara
Possible absence of critical thickness and size effect in ultrathin perovskite ferroelectric films
description Understanding ferroelectricity at reduced dimensions will be important for future sub-nanoscale devices based on ferroelectrics. Using high resolution electron microscopy; Gaoet al., observe the existence of a measurable polarization at a thickness of just 1.5-unit cells
format article
author Peng Gao
Zhangyuan Zhang
Mingqiang Li
Ryo Ishikawa
Bin Feng
Heng-Jui Liu
Yen-Lin Huang
Naoya Shibata
Xiumei Ma
Shulin Chen
Jingmin Zhang
Kaihui Liu
En-Ge Wang
Dapeng Yu
Lei Liao
Ying-Hao Chu
Yuichi Ikuhara
author_facet Peng Gao
Zhangyuan Zhang
Mingqiang Li
Ryo Ishikawa
Bin Feng
Heng-Jui Liu
Yen-Lin Huang
Naoya Shibata
Xiumei Ma
Shulin Chen
Jingmin Zhang
Kaihui Liu
En-Ge Wang
Dapeng Yu
Lei Liao
Ying-Hao Chu
Yuichi Ikuhara
author_sort Peng Gao
title Possible absence of critical thickness and size effect in ultrathin perovskite ferroelectric films
title_short Possible absence of critical thickness and size effect in ultrathin perovskite ferroelectric films
title_full Possible absence of critical thickness and size effect in ultrathin perovskite ferroelectric films
title_fullStr Possible absence of critical thickness and size effect in ultrathin perovskite ferroelectric films
title_full_unstemmed Possible absence of critical thickness and size effect in ultrathin perovskite ferroelectric films
title_sort possible absence of critical thickness and size effect in ultrathin perovskite ferroelectric films
publisher Nature Portfolio
publishDate 2017
url https://doaj.org/article/337d84424ee94563b736d05bd1d5fa1c
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