Possible absence of critical thickness and size effect in ultrathin perovskite ferroelectric films
Understanding ferroelectricity at reduced dimensions will be important for future sub-nanoscale devices based on ferroelectrics. Using high resolution electron microscopy; Gaoet al., observe the existence of a measurable polarization at a thickness of just 1.5-unit cells
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Nature Portfolio
2017
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oai:doaj.org-article:337d84424ee94563b736d05bd1d5fa1c2021-12-02T15:38:31ZPossible absence of critical thickness and size effect in ultrathin perovskite ferroelectric films10.1038/ncomms155492041-1723https://doaj.org/article/337d84424ee94563b736d05bd1d5fa1c2017-06-01T00:00:00Zhttps://doi.org/10.1038/ncomms15549https://doaj.org/toc/2041-1723Understanding ferroelectricity at reduced dimensions will be important for future sub-nanoscale devices based on ferroelectrics. Using high resolution electron microscopy; Gaoet al., observe the existence of a measurable polarization at a thickness of just 1.5-unit cellsPeng GaoZhangyuan ZhangMingqiang LiRyo IshikawaBin FengHeng-Jui LiuYen-Lin HuangNaoya ShibataXiumei MaShulin ChenJingmin ZhangKaihui LiuEn-Ge WangDapeng YuLei LiaoYing-Hao ChuYuichi IkuharaNature PortfolioarticleScienceQENNature Communications, Vol 8, Iss 1, Pp 1-8 (2017) |
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DOAJ |
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Science Q |
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Science Q Peng Gao Zhangyuan Zhang Mingqiang Li Ryo Ishikawa Bin Feng Heng-Jui Liu Yen-Lin Huang Naoya Shibata Xiumei Ma Shulin Chen Jingmin Zhang Kaihui Liu En-Ge Wang Dapeng Yu Lei Liao Ying-Hao Chu Yuichi Ikuhara Possible absence of critical thickness and size effect in ultrathin perovskite ferroelectric films |
description |
Understanding ferroelectricity at reduced dimensions will be important for future sub-nanoscale devices based on ferroelectrics. Using high resolution electron microscopy; Gaoet al., observe the existence of a measurable polarization at a thickness of just 1.5-unit cells |
format |
article |
author |
Peng Gao Zhangyuan Zhang Mingqiang Li Ryo Ishikawa Bin Feng Heng-Jui Liu Yen-Lin Huang Naoya Shibata Xiumei Ma Shulin Chen Jingmin Zhang Kaihui Liu En-Ge Wang Dapeng Yu Lei Liao Ying-Hao Chu Yuichi Ikuhara |
author_facet |
Peng Gao Zhangyuan Zhang Mingqiang Li Ryo Ishikawa Bin Feng Heng-Jui Liu Yen-Lin Huang Naoya Shibata Xiumei Ma Shulin Chen Jingmin Zhang Kaihui Liu En-Ge Wang Dapeng Yu Lei Liao Ying-Hao Chu Yuichi Ikuhara |
author_sort |
Peng Gao |
title |
Possible absence of critical thickness and size effect in ultrathin perovskite ferroelectric films |
title_short |
Possible absence of critical thickness and size effect in ultrathin perovskite ferroelectric films |
title_full |
Possible absence of critical thickness and size effect in ultrathin perovskite ferroelectric films |
title_fullStr |
Possible absence of critical thickness and size effect in ultrathin perovskite ferroelectric films |
title_full_unstemmed |
Possible absence of critical thickness and size effect in ultrathin perovskite ferroelectric films |
title_sort |
possible absence of critical thickness and size effect in ultrathin perovskite ferroelectric films |
publisher |
Nature Portfolio |
publishDate |
2017 |
url |
https://doaj.org/article/337d84424ee94563b736d05bd1d5fa1c |
work_keys_str_mv |
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