Possible absence of critical thickness and size effect in ultrathin perovskite ferroelectric films

Possible absence of critical thickness and size effect in ultrathin perovskite ferroelectric films

Understanding ferroelectricity at reduced dimensions will be important for future sub-nanoscale devices based on ferroelectrics. Using high resolution electron microscopy; Gaoet al., observe the existence of a measurable polarization at a thickness of just 1.5-unit cells

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Detalles Bibliográficos
Autores principales: Peng Gao, Zhangyuan Zhang, Mingqiang Li, Ryo Ishikawa, Bin Feng, Heng-Jui Liu, Yen-Lin Huang, Naoya Shibata, Xiumei Ma, Shulin Chen, Jingmin Zhang, Kaihui Liu, En-Ge Wang, Dapeng Yu, Lei Liao, Ying-Hao Chu, Yuichi Ikuhara
Formato: article
Lenguaje:EN
Publicado: Nature Portfolio 2017
Materias:
Science
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Acceso en línea:https://doaj.org/article/337d84424ee94563b736d05bd1d5fa1c
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