Multi-petahertz electron interference in Cr:Al2O3 solid-state material
Signal processing in electronic devices is in the THz regime. Here the authors measure NIR lightwave-field-induced multiple dipole oscillations in Cr:Al2O3 in the time domain reaching PHz scale by using an isolated attosecond pulse and this method shows potential for higher speed signal processing.
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| Autores principales: | , , , , , , |
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| Formato: | article |
| Lenguaje: | EN |
| Publicado: |
Nature Portfolio
2018
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| Materias: | |
| Acceso en línea: | https://doaj.org/article/3419a74777e449fb97d2b8a30bebbac2 |
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| Sumario: | Signal processing in electronic devices is in the THz regime. Here the authors measure NIR lightwave-field-induced multiple dipole oscillations in Cr:Al2O3 in the time domain reaching PHz scale by using an isolated attosecond pulse and this method shows potential for higher speed signal processing. |
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