Multi-petahertz electron interference in Cr:Al2O3 solid-state material

Signal processing in electronic devices is in the THz regime. Here the authors measure NIR lightwave-field-induced multiple dipole oscillations in Cr:Al2O3 in the time domain reaching PHz scale by using an isolated attosecond pulse and this method shows potential for higher speed signal processing.

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Detalles Bibliográficos
Autores principales: Hiroki Mashiko, Yuta Chisuga, Ikufumi Katayama, Katsuya Oguri, Hiroyuki Masuda, Jun Takeda, Hideki Gotoh
Formato: article
Lenguaje:EN
Publicado: Nature Portfolio 2018
Materias:
Q
Acceso en línea:https://doaj.org/article/3419a74777e449fb97d2b8a30bebbac2
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