Liu, M., Li, X., Cheng, W., Li, Z., & Li, Z. (2021). Radiation Hardness Property of Ultra-Fast 3D-Trench Electrode Silicon Detector on N-Type Substrate. MDPI AG.
Cita Chicago Style (17a ed.)Liu, Manwen, Xinqing Li, Wenzheng Cheng, Zheng Li, y Zhihua Li. Radiation Hardness Property of Ultra-Fast 3D-Trench Electrode Silicon Detector on N-Type Substrate. MDPI AG, 2021.
Cita MLA (8a ed.)Liu, Manwen, et al. Radiation Hardness Property of Ultra-Fast 3D-Trench Electrode Silicon Detector on N-Type Substrate. MDPI AG, 2021.
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