Correlating dynamic strain and photoluminescence of solid-state defects with stroboscopic x-ray diffraction microscopy
Dynamic strain in silicon carbide can tune point defect properties and coherently control their electron spins. Here the authors fabricate Gaussian-shaped surface acoustic wave transducers, use stroboscopic x-ray imaging to measure lattice dynamics, and observe its effects on defect photoluminescenc...
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| Autores principales: | , , , , |
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| Formato: | article |
| Lenguaje: | EN |
| Publicado: |
Nature Portfolio
2019
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| Materias: | |
| Acceso en línea: | https://doaj.org/article/39a297b25c244efdb935ec5a7c8a7d64 |
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| Sumario: | Dynamic strain in silicon carbide can tune point defect properties and coherently control their electron spins. Here the authors fabricate Gaussian-shaped surface acoustic wave transducers, use stroboscopic x-ray imaging to measure lattice dynamics, and observe its effects on defect photoluminescence. |
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