Correlating dynamic strain and photoluminescence of solid-state defects with stroboscopic x-ray diffraction microscopy
Dynamic strain in silicon carbide can tune point defect properties and coherently control their electron spins. Here the authors fabricate Gaussian-shaped surface acoustic wave transducers, use stroboscopic x-ray imaging to measure lattice dynamics, and observe its effects on defect photoluminescenc...
Guardado en:
| Autores principales: | , , , , |
|---|---|
| Formato: | article |
| Lenguaje: | EN |
| Publicado: |
Nature Portfolio
2019
|
| Materias: | |
| Acceso en línea: | https://doaj.org/article/39a297b25c244efdb935ec5a7c8a7d64 |
| Etiquetas: |
Agregar Etiqueta
Sin Etiquetas, Sea el primero en etiquetar este registro!
|
Sea el primero en dejar un comentario!