Light induced phenomena in new polymeric thin films based on aminostyrene
The light-induced modification of mechanical and optical properties of several amino- styrene-containing polymers has been investigated. The nano- and microindentation techniques were used for determination of mechanical parameters. The variable-energy positron annihilation spectroscopy (slow-posi...
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D.Ghitu Institute of Electronic Engineering and Nanotechnologies
2006
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oai:doaj.org-article:3fd9cd52d6e4446cb17aaef029ffb7182021-11-21T12:08:58ZLight induced phenomena in new polymeric thin films based on aminostyrene 2537-63651810-648Xhttps://doaj.org/article/3fd9cd52d6e4446cb17aaef029ffb7182006-12-01T00:00:00Zhttps://mjps.nanotech.md/archive/2006/article/3522https://doaj.org/toc/1810-648Xhttps://doaj.org/toc/2537-6365The light-induced modification of mechanical and optical properties of several amino- styrene-containing polymers has been investigated. The nano- and microindentation techniques were used for determination of mechanical parameters. The variable-energy positron annihilation spectroscopy (slow-positron beam technique) was developed to measure defect depth profiles in the near-surface region. The increase of S-parameter with the increasing of nanohardness and elastic modulus were determined for these materials. Palistrant, NataliaD.Ghitu Institute of Electronic Engineering and NanotechnologiesarticlePhysicsQC1-999ElectronicsTK7800-8360ENMoldavian Journal of the Physical Sciences, Vol 5, Iss 3-4, Pp 304-311 (2006) |
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Physics QC1-999 Electronics TK7800-8360 |
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Physics QC1-999 Electronics TK7800-8360 Palistrant, Natalia Light induced phenomena in new polymeric thin films based on aminostyrene |
description |
The light-induced modification of mechanical and optical properties of several amino-
styrene-containing polymers has been investigated. The nano- and microindentation techniques were used for determination of mechanical parameters. The variable-energy positron
annihilation spectroscopy (slow-positron beam technique) was developed to measure defect
depth profiles in the near-surface region. The increase of S-parameter with the increasing of
nanohardness and elastic modulus were determined for these materials. |
format |
article |
author |
Palistrant, Natalia |
author_facet |
Palistrant, Natalia |
author_sort |
Palistrant, Natalia |
title |
Light induced phenomena in new polymeric thin films based on aminostyrene |
title_short |
Light induced phenomena in new polymeric thin films based on aminostyrene |
title_full |
Light induced phenomena in new polymeric thin films based on aminostyrene |
title_fullStr |
Light induced phenomena in new polymeric thin films based on aminostyrene |
title_full_unstemmed |
Light induced phenomena in new polymeric thin films based on aminostyrene |
title_sort |
light induced phenomena in new polymeric thin films based on aminostyrene |
publisher |
D.Ghitu Institute of Electronic Engineering and Nanotechnologies |
publishDate |
2006 |
url |
https://doaj.org/article/3fd9cd52d6e4446cb17aaef029ffb718 |
work_keys_str_mv |
AT palistrantnatalia lightinducedphenomenainnewpolymericthinfilmsbasedonaminostyrene |
_version_ |
1718419180001165312 |