Electrically-triggered micro-explosion in a graphene/SiO2/Si structure

Abstract Electrically-triggered micro-explosions in a metal-insulator-semiconductor (MIS) structure can fragment/atomize analytes placed on it, offering an interesting application potential for chip-scale implementation of atomic emission spectroscopy (AES). We have investigated the mechanisms of mi...

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Autores principales:	Siyang Liu, Myungji Kim, Hong Koo Kim
Formato:	article
Lenguaje:	EN
Publicado:	Nature Portfolio 2018
Materias:	Medicine R Science Q
Acceso en línea:	https://doaj.org/article/3ffaee1b8bac4f889d3730f384b8dde7
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spelling	oai:doaj.org-article:3ffaee1b8bac4f889d3730f384b8dde72021-12-02T16:08:01ZElectrically-triggered micro-explosion in a graphene/SiO2/Si structure10.1038/s41598-018-25776-z2045-2322https://doaj.org/article/3ffaee1b8bac4f889d3730f384b8dde72018-05-01T00:00:00Zhttps://doi.org/10.1038/s41598-018-25776-zhttps://doaj.org/toc/2045-2322Abstract Electrically-triggered micro-explosions in a metal-insulator-semiconductor (MIS) structure can fragment/atomize analytes placed on it, offering an interesting application potential for chip-scale implementation of atomic emission spectroscopy (AES). We have investigated the mechanisms of micro-explosions occurring in a graphene/SiO2/Si (GOS) structure under a high-field pulsed voltage drive. Micro-explosions are found to occur more readily in inversion bias than in accumulation bias. Explosion damages in inversion-biased GOS differ significantly between n-Si and p-Si substrate cases: a highly localized, circular, protruding cone-shape melt of Si for the n-Si GOS case, whereas shallow, irregular, laterally-propagating trenches in SiO2/Si for the p-Si GOS case. These differing damage morphologies are explained by different carrier-multiplication processes: in the n-Si case, impact ionization propagates from SiO2 to Si, causing highly-localized melt explosions of Si in the depletion region, whereas in the p-Si case, from SiO2 towards graphene electrode, resulting in laterally wide-spread micro-explosions. These findings are expected to help optimize the GOS-based atomizer structure for low voltage, small-volume analyte, high sensitivity chip-scale emission spectroscopy.Siyang LiuMyungji KimHong Koo KimNature PortfolioarticleMedicineRScienceQENScientific Reports, Vol 8, Iss 1, Pp 1-11 (2018)
institution	DOAJ
collection	DOAJ
language	EN
topic	Medicine R Science Q
spellingShingle	Medicine R Science Q Siyang Liu Myungji Kim Hong Koo Kim Electrically-triggered micro-explosion in a graphene/SiO2/Si structure
description	Abstract Electrically-triggered micro-explosions in a metal-insulator-semiconductor (MIS) structure can fragment/atomize analytes placed on it, offering an interesting application potential for chip-scale implementation of atomic emission spectroscopy (AES). We have investigated the mechanisms of micro-explosions occurring in a graphene/SiO2/Si (GOS) structure under a high-field pulsed voltage drive. Micro-explosions are found to occur more readily in inversion bias than in accumulation bias. Explosion damages in inversion-biased GOS differ significantly between n-Si and p-Si substrate cases: a highly localized, circular, protruding cone-shape melt of Si for the n-Si GOS case, whereas shallow, irregular, laterally-propagating trenches in SiO2/Si for the p-Si GOS case. These differing damage morphologies are explained by different carrier-multiplication processes: in the n-Si case, impact ionization propagates from SiO2 to Si, causing highly-localized melt explosions of Si in the depletion region, whereas in the p-Si case, from SiO2 towards graphene electrode, resulting in laterally wide-spread micro-explosions. These findings are expected to help optimize the GOS-based atomizer structure for low voltage, small-volume analyte, high sensitivity chip-scale emission spectroscopy.
format	article
author	Siyang Liu Myungji Kim Hong Koo Kim
author_facet	Siyang Liu Myungji Kim Hong Koo Kim
author_sort	Siyang Liu
title	Electrically-triggered micro-explosion in a graphene/SiO2/Si structure
title_short	Electrically-triggered micro-explosion in a graphene/SiO2/Si structure
title_full	Electrically-triggered micro-explosion in a graphene/SiO2/Si structure
title_fullStr	Electrically-triggered micro-explosion in a graphene/SiO2/Si structure
title_full_unstemmed	Electrically-triggered micro-explosion in a graphene/SiO2/Si structure
title_sort	electrically-triggered micro-explosion in a graphene/sio2/si structure
publisher	Nature Portfolio
publishDate	2018
url	https://doaj.org/article/3ffaee1b8bac4f889d3730f384b8dde7
work_keys_str_mv	AT siyangliu electricallytriggeredmicroexplosioninagraphenesio2sistructure AT myungjikim electricallytriggeredmicroexplosioninagraphenesio2sistructure AT hongkookim electricallytriggeredmicroexplosioninagraphenesio2sistructure
_version_	1718384650267656192

Electrically-triggered micro-explosion in a graphene/SiO2/Si structure

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