Tian, T., Zhang, S., Guo, Y., Zhang, J., Pan, D. Z., & Yang, K. (2019). A New Low Turn-Off Loss SOI Lateral Insulated Gate Bipolar Transistor With Buried Variation of Lateral Doping Layer. IEEE.
Style de citation Chicago (17e éd.)Tian, Tao, Sheng-Li Zhang, Yu-Feng Guo, Jun Zhang, David Z. Pan, et Ke-Meng Yang. A New Low Turn-Off Loss SOI Lateral Insulated Gate Bipolar Transistor With Buried Variation of Lateral Doping Layer. IEEE, 2019.
Style de citation MLA (8e éd.)Tian, Tao, et al. A New Low Turn-Off Loss SOI Lateral Insulated Gate Bipolar Transistor With Buried Variation of Lateral Doping Layer. IEEE, 2019.
Attention : ces citations peuvent ne pas être correctes à 100%.