Morphology and structure of ZIF-8 during crystallisation measured by dynamic angle-resolved second harmonic scattering
Angle-resolved monitoring of structure parameters during crystal growth is often slow owing to mechanical movements. Here, the authors use second harmonic scattering and Fourier-plane imaging to dynamically monitor size, shape and concentration of ZIF-8 in situ during the growth process.
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| Autores principales: | , , , , , , |
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| Formato: | article |
| Lenguaje: | EN |
| Publicado: |
Nature Portfolio
2018
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| Materias: | |
| Acceso en línea: | https://doaj.org/article/4407bbbda9b1473d8f1999e3a835af58 |
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| Sumario: | Angle-resolved monitoring of structure parameters during crystal growth is often slow owing to mechanical movements. Here, the authors use second harmonic scattering and Fourier-plane imaging to dynamically monitor size, shape and concentration of ZIF-8 in situ during the growth process. |
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