Morphology and structure of ZIF-8 during crystallisation measured by dynamic angle-resolved second harmonic scattering

Morphology and structure of ZIF-8 during crystallisation measured by dynamic angle-resolved second harmonic scattering

Angle-resolved monitoring of structure parameters during crystal growth is often slow owing to mechanical movements. Here, the authors use second harmonic scattering and Fourier-plane imaging to dynamically monitor size, shape and concentration of ZIF-8 in situ during the growth process.

Guardado en:
Detalles Bibliográficos
Autores principales: Stijn Van Cleuvenbergen, Zachary J. Smith, Olivier Deschaume, Carmen Bartic, Sebastian Wachsmann-Hogiu, Thierry Verbiest, Monique A. van der Veen
Formato: article
Lenguaje:EN
Publicado: Nature Portfolio 2018
Materias:
Science
Q
Acceso en línea:https://doaj.org/article/4407bbbda9b1473d8f1999e3a835af58
Etiquetas: Agregar Etiqueta
Sin Etiquetas, Sea el primero en etiquetar este registro!

Ejemplares similares

Ejemplares similares